Camelia Hora

24 papers A 9B 2Misc 6Journal 7
YearRankTypeTitle / Venue / Authors
2013 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2012 J jnl
Defect Oriented Testing for Analog/Mixed-Signal Designs.
IEEE Des. Test Comput.
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
2012 J jnl
Diagnosis of Local Spot Defects in Analog Circuits.
IEEE Trans. Instrum. Meas.
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman
2011 A conf
Defect Oriented Testing for analog/mixed-signal devices.
ITC
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
2011 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 A conf
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.
DATE
Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing
2010 B conf
Diagnosis of full open defects in interconnect lines with fan-out.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2010 Misc conf
Impact of Temperature on Test Quality.
VLSI Design
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
2009 A conf
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
ITC
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
2008 Misc conf
Full Open Defects in Nanometric CMOS.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
ITC
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
2007 Misc conf
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 Misc conf
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 J jnl
Extending gate-level diagnosis tools to CMOS intra-gate faults.
IET Comput. Digit. Tech.
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
2006 Misc conf
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS
Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud
2005 A conf
A novel stuck-at based method for transistor stuck-open fault diagnosis.
ITC
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
2005 B conf
Stuck-open fault diagnosis with stuck-at model.
ETS
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
2004 A conf
Systematic Defects in Deep Sub-Micron Technologies.
ITC
Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
2004 A conf
Trends in Testing Integrated Circuits.
ITC
Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge
2003 Misc conf
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
VTS
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
2003 J jnl
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electron. Test.
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
2002 A conf
An Effective Diagnosis Method to Support Yield Improvement.
ITC
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg