C. T. Wu

11 papers Journal 8Unranked 3
YearRankTypeTitle / Venue / Authors
2026 J jnl
Systematic Performance Assessment of Deep Material Networks for Multiscale Material Modeling.
CoRR
Xiaolong He, Haoyan Wei, Wei Hu, Henan Mao, C. T. Wu
2025 J jnl
A GPU-Accelerated Three-Dimensional Crack Element Method for Transient Dynamic Fracture Simulation.
CoRR
Yuxi Xie, C. T. Wu, Wei Hu, Lu Xu, Tinh Q. Bui, Shaofan Li
2025 — conf
Monolithic 3D Macro Integrating CMOS with Ambipolar SONOS Tunnel FET for High Performance Edge-AI Computing Applications.
IMW
P. H. Tseng, F. M. Lee, C. C. Yang, H. W. Chiang, C. T. Huang, Y. H. Lin, Yu-Yu Lin, N. C. Lin, P. J. Sung, C. T. Wu, W. F. Wu, C. H. Shen, T. H. Hou, A. Y. Wu, H. Y. Cheng, T. H. Yeh, M. H. Lee, K. Y. Hsieh
2024 J jnl
A novel hypergraph convolution network for wafer defect patterns identification based on an unbalanced dataset.
J. Intell. Manuf.
Yuxi Xie, Shaofan Li, C. T. Wu, Zhipeng Lai, Miao Su
2020 J jnl
An h-adaptive meshfree-enriched finite element method based on convex approximations for the three-dimensional ductile crack propagation simulation.
Comput. Aided Geom. Des.
Bo Ren, C. T. Wu, Dandan Lyu
2019 J jnl
Exploring the 3D architectures of deep material network in data-driven multiscale mechanics.
CoRR
Zeliang Liu, C. T. Wu
2018 J jnl
A Deep Material Network for Multiscale Topology Learning and Accelerated Nonlinear Modeling of Heterogeneous Materials.
CoRR
Zeliang Liu, C. T. Wu, M. Koishi
2016 J jnl
Failure and stress analysis of through-aluminum-nitride-via substrates during thermal reliability tests for high power LED applications.
Microelectron. Reliab.
Ming-Yi Tsai, C. H. Lin, K. F. Chuang, Y. H. Chang, C. T. Wu, S. C. Hu
2015 J jnl
Mechanical design and analysis of direct-plated-copper aluminum nitride substrates for enhancing thermal reliability.
Microelectron. Reliab.
Ming-Yi Tsai, P. S. Huang, C. H. Lin, C. T. Wu, S. C. Hu
2001 — conf
Building Web Applications Using Java 2 Enterprise Edition.
TOOLS (39)
C. T. Wu
1987 — conf
Towards fully-computerized database maintenance for non-traditional appliances.
FJCC
C. T. Wu