C. Mark Johnson

16 papers Journal 12Unranked 4
YearRankTypeTitle / Venue / Authors
2016 J jnl
A thermal cycling reliability study of ultrasonically bonded copper wires.
Microelectron. Reliab.
Elaheh Arjmand, Pearl A. Agyakwa, Martin R. Corfield, Jianfeng Li, Bassem Mouawad, C. Mark Johnson
2016 J jnl
Quantification of cracked area in thermal path of high-power multi-chip modules using transient thermal impedance measurement.
Microelectron. Reliab.
Mohd. Amir Eleffendi, Li Yang, Pearl A. Agyakwa, C. Mark Johnson
2015 — conf
A novel stochastic modelling approach for electric vehicle charging power and energy requirements.
ISGT
Amir Fazeli, C. Mark Johnson, Mark Sumner, Edward Christopher
2015 — conf
Investigating the impact of varying the number of distributed energy resources on controlling the power flow within a microgrid.
ISGT
Amir Fazeli, Mark Sumner, C. Mark Johnson, Edward Christopher
2014 J jnl
Application of coupled electro-thermal and physics-of-failure-based analysis to the design of accelerated life tests for power modules.
Microelectron. Reliab.
Mahera Musallam, Chunyan Yin, Chris Bailey, C. Mark Johnson
2014 J jnl
Reliability of thick Al wire: A study of the effects of wire bonding parameters on thermal cycling degradation rate using non-destructive methods.
Microelectron. Reliab.
Elaheh Arjmand, Pearl A. Agyakwa, C. Mark Johnson
2013 J jnl
Degradation of thermal interface materials for high-temperature power electronics applications.
Microelectron. Reliab.
Robert Skuriat, Jianfeng Li, Pearl A. Agyakwa, Nevil Mattey, Paul Evans, C. Mark Johnson
2012 J jnl
A closed-loop IGBT non-destructive tester.
Microelectron. Reliab.
Ashraf Ahmed, Yasaman Shadrokh, Lee Coulbeck, Alberto Castellazzi, C. Mark Johnson
2012 J jnl
An Efficient Implementation of the Rainflow Counting Algorithm for Life Consumption Estimation.
IEEE Trans. Reliab.
Mahera Musallam, C. Mark Johnson
2012 — conf
Coordinated optimal dispatch of distributed energy resources within a smart energy community cell.
ISGT Europe
Amir Fazeli, Mark Sumner, C. Mark Johnson, Edward Christopher
2012 J jnl
Repetitive high peak current pulsed discharge film-capacitor reliability testing.
Microelectron. Reliab.
H. Q. S. Dang, Martin R. Corfield, Alberto Castellazzi, C. Mark Johnson, Patrick Wheeler
2011 J jnl
A time-domain physics-of-failure model for the lifetime prediction of wire bond interconnects.
Microelectron. Reliab.
Li Yang, Pearl A. Agyakwa, C. Mark Johnson
2011 — conf
Investigating the effects of dynamic demand side management within intelligent Smart Energy communities of future decentralized power system.
ISGT Europe
Amir Fazeli, Edward Christopher, C. Mark Johnson, Mark Gillott, Mark Sumner
2011 J jnl
Microstructural evolution of ultrasonically bonded high purity Al wire during extended range thermal cycling.
Microelectron. Reliab.
Pearl A. Agyakwa, Martin R. Corfield, Li Yang, Jianfeng Li, V. M. F. Marques, C. Mark Johnson
2010 J jnl
Designing a Low-Cost, Electricity-Generating Cooking Stove.
IEEE Technol. Soc. Mag.
Paul H. Riley, Chitta Saha, C. Mark Johnson
2007 J jnl
Estimation and control of power electronic device temperature during operation with variable conducting current.
IET Circuits Devices Syst.
Mahera Musallam, Paul P. Acarnley, C. Mark Johnson, Len Pritchard, Volker Pickert