C. A. Dimitriadis

14 papers C 2Journal 9Unranked 3
YearRankTypeTitle / Venue / Authors
2016 J jnl
Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.
Microelectron. Reliab.
Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis
2016 — conf
Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.
ESSDERC
R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo
2014 — conf
Variability of nanoscale triple gate FinFETs: Prediction and analysis method.
ICECS
Dimitrios H. Tassis, Ioannis Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis
2012 — conf
Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs.
ICECS
Nikolaos Fasarakis, Andreas Tsormpatzoglou, Dimitrios H. Tassis, Konstantinos Papathanasiou, C. A. Dimitriadis, Gérard Ghibaudo
2011 J jnl
Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors.
Microelectron. Reliab.
N. A. Hastas, N. Arpatzanis, C. A. Dimitriadis, Julien Brochet, François Templier, G. Kamarinos
2008 J jnl
Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.
Microelectron. Reliab.
N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos
2006 C conf
A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs.
ISCAS
Ilias Pappas, Lazaros Nalpantidis, Vasilios Kalenteridis, Stilianos Siskos, Alkis A. Hatzopoulos, C. A. Dimitriadis
2006 J jnl
Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.
Microelectron. Reliab.
Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos
2006 J jnl
Effects of hot carriers in offset gated polysilicon thin-film transistors.
Microelectron. Reliab.
Argyrios T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos
2006 C conf
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
ISCAS
Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos
2006 J jnl
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.
Microelectron. J.
Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos
2005 J jnl
Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors.
Microelectron. Reliab.
N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, Adonios Thanailakis
2003 J jnl
Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors.
Microelectron. Reliab.
N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva
2003 J jnl
Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors.
Microelectron. Reliab.
N. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos