Byungjin Chung

12 papers Journal 3Unranked 9
YearRankTypeTitle / Venue / Authors
2024 — conf
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.
IRPS
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
2024 — conf
Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.
IRPS
Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae
2023 — conf
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM.
IRPS
Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae
2022 — conf
Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.
IRPS
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2022 — conf
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.
IRPS
Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2021 — conf
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology.
IRPS
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi
2020 — conf
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.
IRPS
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2020 J jnl
Bi-Sequential Video Error Concealment Method Using Adaptive Homography-Based Registration.
IEEE Trans. Circuits Syst. Video Technol.
Byungjin Chung, Changhoon Yim
2020 — conf
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.
IRPS
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
2019 — conf
Super-Resolution Convolutional Neural Networks Using Modified and Bilateral ReLU.
ICEIC
Hyeongyeom Ahn, Byungjin Chung, Changhoon Yim
2018 J jnl
Fast intra prediction method by adaptive number of candidate modes for RDO in HEVC.
Inf. Process. Lett.
Byungjin Chung, Changhoon Yim
2014 J jnl
Hybrid error concealment method combining exemplar-based image inpainting and spatial interpolation.
Signal Process. Image Commun.
Byungjin Chung, Changhoon Yim