Byron J. Williams

25 papers A* 1A 1B 2C 3Journal 8Unranked 10
YearRankTypeTitle / Venue / Authors
2023 J jnl
A Software Vulnerability Prediction Model Using Traceable Code Patterns and Software Metrics.
SN Comput. Sci.
Kazi Zakia Sultana, Charles B. Boyd, Byron J. Williams
2020 A* conf
BigMAC: Fine-Grained Policy Analysis of Android Firmware.
USENIX Security Symposium
Grant Hernandez, Dave (Jing) Tian, Anurag Swarnim Yadav, Byron J. Williams, Kevin R. B. Butler
2020 C conf
Examining the Relationship of Code and Architectural Smells with Software Vulnerabilities.
APSEC
Kazi Zakia Sultana, Zadia Codabux, Byron J. Williams
2020 J jnl
Examining the Relationship of Code and Architectural Smells with Software Vulnerabilities.
CoRR
Kazi Zakia Sultana, Zadia Codabux, Byron J. Williams
2019 J jnl
A study examining relationships between micro patterns and security vulnerabilities.
Softw. Qual. J.
Kazi Zakia Sultana, Byron J. Williams, Tanmay Bhowmik
2018 C conf
A Comparison of Nano-Patterns vs. Software Metrics in Vulnerability Prediction.
APSEC
Kazi Zakia Sultana, Byron J. Williams, Amiangshu Bosu
2017 J jnl
An empirical assessment of technical debt practices in industry.
J. Softw. Evol. Process.
Zadia Codabux, Byron J. Williams, Gary L. Bradshaw, Murray Cantor
2017 — conf
Correlation Analysis among Java Nano-Patterns and Software Vulnerabilities.
HASE
Kazi Zakia Sultana, Ajay Deo, Byron J. Williams
2017 J jnl
The Relationship Between Code Smells and Traceable Patterns - Are They Measuring the Same Thing?
Int. J. Softw. Eng. Knowl. Eng.
Zadia Codabux, Kazi Zakia Sultana, Byron J. Williams
2017 C conf
The Relationship between Traceable Code Patterns and Code Smells.
SEKE
Zadia Codabux, Kazi Zakia Sultana, Byron J. Williams
2016 B conf
A Preliminary Study Examining Relationships Between Nano-Patterns and Software Security Vulnerabilities.
COMPSAC
Kazi Zakia Sultana, Ajay Deo, Byron J. Williams
2016 B conf
Human Subject Evaluation of Computer-Security Training Recommender.
COMPSAC
Muhammad Nadeem, Byron J. Williams, Gary L. Bradshaw, Edward B. Allen
2016 — conf
Technical debt prioritization using predictive analytics.
ICSE (Companion Volume)
Zadia Codabux, Byron J. Williams
2015 — conf
A Method for Recommending Computer-Security Training for Software Developers: Leveraging the Power of Static Analysis Techniques and Vulnerability Repositories.
ITNG
Muhammad Nadeem, Edward B. Allen, Byron J. Williams
2014 — conf
Computer Security Training Recommender for Developers.
RecSys Posters
Muhammad Nadeem, Edward B. Allen, Byron J. Williams
2014 J jnl
Examination of the software architecture change characterization scheme using three empirical studies.
Empir. Softw. Eng.
Byron J. Williams, Jeffrey C. Carver
2014 — conf
The Correspondence Between Software Quality Models and Technical Debt Estimation Approaches.
MTD@ICSME
Isaac Griffith, Derek Reimanis, Clemente Izurieta, Zadia Codabux, Ajay Deo, Byron J. Williams
2013 — conf
Empirical evidence of code decay: A systematic mapping study.
WCRE
Ajay Bandi, Byron J. Williams, Edward B. Allen
2013 — conf
Managing technical debt: an industrial case study.
MTD@ICSE
Zadia Codabux, Byron J. Williams
2012 — conf
Exception Handling Defects: An Empirical Study.
HASE
Puntitra Sawadpong, Edward B. Allen, Byron J. Williams
2012 — conf
High false positive detection of security vulnerabilities: a case study.
ACM Southeast Regional Conference
Muhammad Nadeem, Byron J. Williams, Edward B. Allen
2010 J jnl
Characterizing software architecture changes: A systematic review.
Inf. Softw. Technol.
Byron J. Williams, Jeffrey C. Carver
2007 A conf
Characterizing Software Architecture Changes: An Initial Study.
ESEM
Byron J. Williams, Jeffrey C. Carver
2006 — conf
Change Risk Assessment: Understanding Risks Involved in Changing Software Requirements.
Software Engineering Research and Practice
Byron J. Williams, Jeffrey C. Carver, Rayford B. Vaughn
2005 J jnl
Functionality and structure of the service broker in advanced service architectures.
Bell Labs Tech. J.
Nicholas M. DeVito, Richard T. Emery, Kristin F. Kocan, William D. Roome, Byron J. Williams