Byoungho Kim

18 papers B 1Misc 3Journal 14
YearRankTypeTitle / Venue / Authors
2025 J jnl
Built-off self-calibration scheme for ADCs based on shifting transfer-characteristics.
IEICE Electron. Express
Myeonggu Gil, Jaehyun Park, Jacob A. Abraham, Byoungho Kim
2020 J jnl
Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters.
IEEE Access
Byoungho Kim, Jacob A. Abraham
2019 J jnl
Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications.
IEEE Trans. Ind. Electron.
Byoungho Kim, Jacob A. Abraham
2016 J jnl
A Low-Power Incremental Delta-Sigma ADC for CMOS Image Sensors.
IEEE Trans. Circuits Syst. II Express Briefs
Ilseop Lee, Byoungho Kim, Byung-Geun Lee
2016 J jnl
Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications.
IEEE Trans. Circuits Syst. II Express Briefs
Byoungho Kim
2015 J jnl
A 10-bit 200-MS/s Zero-Crossing-Based Pipeline ADC in 0.13-µm CMOS Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Myonglae Chu, Byoungho Kim, Byung-Geun Lee
2015 J jnl
Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron.
IEEE Trans. Ind. Electron.
Myonglae Chu, Byoungho Kim, Sangsu Park, Hyunsang Hwang, Moongu Jeon, Byoung Hun Lee, Byung-Geun Lee
2014 J jnl
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits.
IEEE Trans. Circuits Syst. II Express Briefs
Byoungho Kim, Jacob A. Abraham
2014 J jnl
Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits.
IEEE Trans. Circuits Syst. II Express Briefs
Byoungho Kim, Jacob A. Abraham
2013 J jnl
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems.
IEEE Trans. Circuits Syst. II Express Briefs
Byoungho Kim, Jacob A. Abraham
2012 J jnl
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems.
IEEE Trans. Circuits Syst. II Express Briefs
Byoungho Kim, Jacob A. Abraham
2011 J jnl
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
Byoungho Kim, Jacob A. Abraham
2011 J jnl
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications.
IEEE Trans. Instrum. Meas.
Byoungho Kim, Jacob A. Abraham
2008 Misc conf
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.
VTS
Byoungho Kim, Nash Khouzam, Jacob A. Abraham
2007 J jnl
Predicting mixed-signal dynamic performance using optimised signature-based alternate test.
IET Comput. Digit. Tech.
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
2007 Misc conf
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications.
VTS
Byoungho Kim, Zhenhai Fu, Jacob A. Abraham
2006 B conf
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
ETS
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
2006 Misc conf
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
VTS
Hongjoong Shin, Byoungho Kim, Jacob A. Abraham