Byeng Dong Youn

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2024 J jnl
Frequency-focused sound data generator for fault diagnosis in industrial robots.
J. Comput. Des. Eng.
Semin Ahn, Jinoh Yoo, Kyu-Wha Lee, Byeng Dong Youn, Sung-Hoon Ahn
2024 J jnl
Peripheral artery disease diagnosis based on deep learning-enabled analysis of non-invasive arterial pulse waveforms.
Comput. Biol. Medicine
Sina Masoumi Shahrbabak, Sooho Kim, Byeng Dong Youn, Hao-Min Cheng, Chen-Huan Chen, Ramakrishna Mukkamala, Jin-Oh Hahn
2022 J jnl
Prognostic health management of the robotic strain wave gear reducer based on variable speed of operation: a data-driven via deep learning approach.
J. Comput. Des. Eng.
Izaz Raouf, Hyewon Lee, Yeong Rim Noh, Byeng Dong Youn, Heung Soo Kim
2021 J jnl
Deep Learning-Based Diagnosis of Peripheral Artery Disease via Continuous Property-Adversarial Regularization: Preliminary in Silico Study.
IEEE Access
Sooho Kim, Jin-Oh Hahn, Byeng Dong Youn
2021 J jnl
Reliability analysis of a tendon-driven actuation for soft robots.
Int. J. Robotics Res.
Useok Jeong, Keunsu Kim, Sang-Hun Kim, Hyunhee Choi, Byeng Dong Youn, Kyu-Jin Cho
2020 J jnl
A Semi-Supervised Autoencoder With an Auxiliary Task (SAAT) for Power Transformer Fault Diagnosis Using Dissolved Gas Analysis.
IEEE Access
Sunuwe Kim, Soo-Ho Jo, Wongon Kim, Jongmin Park, Jingyo Jeong, Yeongmin Han, Daeil Kim, Byeng Dong Youn
2020 J jnl
Direct Connection-Based Convolutional Neural Network (DC-CNN) for Fault Diagnosis of Rotor Systems.
IEEE Access
Myungyon Kim, Joon Ha Jung, Jin Uk Ko, Hyeon Bae Kong, Jinwook Lee, Byeng Dong Youn
2020 J jnl
Operation-Adaptive Damage Assessment of Steam Turbines Using a Nonlinear Creep-Fatigue Interaction Model.
IEEE Access
Woosung Choi, Heonjun Yoon, Byeng Dong Youn
2017 J jnl
Assembly yield prediction of plastically encapsulated packages with a large number of manufacturing variables by advanced approximate integration method.
Microelectron. Reliab.
Hsiu-Ping Wei, Bongtae Han, Byeng Dong Youn, Hyuk Shin, Ilho Kim, Hojeong Moon
2017 J jnl
Bivariate Lifetime Model for Organic Light-Emitting Diodes.
IEEE Trans. Ind. Electron.
Dae Whan Kim, Hyunseok Oh, Byeng Dong Youn, Dongil Kwon
2010 J jnl
Forward-stepwise regression analysis for fine leak batch testing of wafer-level hermetic MEMS packages.
Microelectron. Reliab.
Changsoo Jang, Byeng Dong Youn, Ping F. Wang, Bongtae Han, Suk-Jin Ham