Burnell G. West

12 papers A 12

Year	Rank	Type	Title / Venue / Authors
2004	A	`conf`	Digital Synchronization for Reconfigurable ATE. ITC Burnell G. West, Michael F. Jones
2004	A	`conf`	Open Architecture ATE: Prospects and Problems. ITC Burnell G. West
2003	A	`conf`	Multi-GB/s IC Test Challenges and Solutions. ITC Burnell G. West
2003	A	`conf`	Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy. ITC Burnell G. West
2002	A	`conf`	Open ATE Architecture: Key Challenges. ITC Burnell G. West
2001	A	`conf`	Rapid-response temperature control provides new defect screening opportunities. ITC Mark Malinoski, Burnell G. West
2000	A	`conf`	The path to one-picosecond accuracy. ITC Luca Sartori, Burnell G. West
1999	A	`conf`	Accuracy requirements in at-speed functional test. ITC Burnell G. West
1999	A	`conf`	At-speed structural test. ITC Burnell G. West
1998	A	`conf`	Functional ATE can meet the challenges. ITC Burnell G. West
1994	A	`conf`	500-MHz Testing on a 100-MHz Tester. ITC Didier Wimmers, Kris Sakaitani, Burnell G. West
1983	A	`conf`	Attainable Accuracy of Autocalibrating VLSI Test Systems. ITC Burnell G. West