| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2008 | C | conf |
SBAC-PAD
|
| 2007 | A* | conf |
ISCA
|
| 2007 | J | jnl |
IEEE Micro
|
| 2006 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2006 | A* | conf |
MICRO
|
| 2004 | C | conf |
ICCD
|
| 2002 | A* | conf |
ISCA
|
| 2002 | A* | conf |
MICRO
|
| 2002 | A* | conf |
HPCA
|
| 2000 | A* | conf |
ISCA
|
| 1999 | J | jnl |
IEEE Micro
|
| 1999 | A* | conf |
ISCA
|
| 1998 | J | jnl |
Computer
|
| 1998 | A | conf |
International Conference on Supercomputing
|
| 1996 | C | conf |
ICCD
|
| 1991 | J | jnl |
Commun. ACM
|