Bruce C. Kim

67 papers A 9B 5C 4Misc 6Journal 32Unranked 11
YearRankTypeTitle / Venue / Authors
2018 — conf
Design of 3D Inductors for IoT Security.
ISOCC
Bruce C. Kim, Sang-Bock Cho
2017 J jnl
Modeling and Crosstalk Evaluation of 3-D TSV-Based Inductor With Ground TSV Shielding.
IEEE Trans. Very Large Scale Integr. Syst.
Saikat Mondal, Sang-Bock Cho, Bruce C. Kim
2016 — conf
Recent advances in TSV inductors for 3D IC technology.
ISOCC
Bruce C. Kim, Sang-Bock Cho
2016 — conf
Text information acquisition method of traffic signs for autonomous navigation.
APCCAS
Hyun-Tae Kim, Jin-Seong Jeong, Bruce C. Kim, Sang-Bock Cho
2016 — conf
Wide rear vehicle recognition using a fisheye lens camera image.
APCCAS
Jin-Seong Jeong, Hyun-Tae Kim, Bruce C. Kim, Sang-Bock Cho
2014 — conf
A novel BIST technique for LDMOS drivers.
MWSCAS
Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian
2013 C conf
Design of nanosensing platform based on zinc oxide nanowire arrays.
ISCAS
Anurag Gupta, Mitchell Spryn, Bruce C. Kim, Eugene Edwards, Christina Brantley, Paul Ruffin
2013 C conf
Development of hybrid electrical model for CNT based Through Silicon Vias.
ISCAS
Kaushal Kannan, Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho
2013 Misc conf
Physics Based Fault Models for Testing High-Voltage LDMOS.
VLSI Design
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian
2013 J jnl
Physics-Based Low-Cost Test Technique for High Voltage LDMOS.
J. Electron. Test.
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
2012 C conf
Analysis of propagation delay in 3 - D stacked DRAM.
ISCAS
Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho, Byoungchul Ahn
2012 J jnl
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects.
J. Electron. Test.
Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn
2012 C conf
Modeling and characterization of CNT-based TSV for high frequency applications.
ISCAS
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Seok-Ho Noh, Li Li, Sang-Bock Cho
2011 J jnl
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.
J. Electron. Test.
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
2010 A conf
RADPro: Automatic RF analyzer and diagnostic program generation tool.
ITC
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed
2009 A conf
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards.
ITC
Sukeshwar Kannan, Bruce C. Kim
2008 J jnl
Guest Editors' Introduction: The Evolution of RFIC Design and Test.
IEEE Des. Test Comput.
Bruce C. Kim, Craig Force
2008 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2008 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2007 A conf
Low cost automatic mixed-signal board test using IEEE 1149.4.
ITC
Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall
2007 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2007 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2007 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2007 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2007 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2007 J jnl
Test Technology Newsletter - December 2007.
J. Electron. Test.
Bruce C. Kim
2007 J jnl
Test Technology Newsletter - October 2007.
J. Electron. Test.
Bruce C. Kim
2007 J jnl
Test Technology Newsletter April 2007.
J. Electron. Test.
Bruce C. Kim
2007 J jnl
Test Technology Newsletter.
J. Electron. Test.
Bruce C. Kim
2007 J jnl
Test Technology TC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2006 J jnl
A Novel RF Test Scheme Based on a DFT Method.
J. Electron. Test.
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
2006 J jnl
A new low-cost RF built-in self-test measurement for system-on-chip transceivers.
IEEE Trans. Instrum. Meas.
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
2006 A conf
DIBPro: Automatic Diagnostic Program Generation Tool.
ITC
Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal
2006 J jnl
Guest Editors' Introduction: Big Innovations in Small Packages.
IEEE Des. Test Comput.
Bruce C. Kim, Yervant Zorian
2006 Misc conf
Session Abstract.
VTS
Yervant Zorian, Bruce C. Kim
2006 J jnl
TTTC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2006 J jnl
Test Technology TC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2006 J jnl
Test Technology TC Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2006 J jnl
Test Technology Technical Council Newsletter.
IEEE Des. Test Comput.
Bruce C. Kim
2005 — conf
Advanced Mems for High Power Integrated Distribution Systems.
ICMENS
Rahim Kasim, Bruce C. Kim, Josef Drobnik
2005 J jnl
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit.
J. Electron. Test.
Jee-Youl Ryu, Bruce C. Kim
2005 J jnl
Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers.
Microelectron. J.
Jee-Youl Ryu, Bruce C. Kim
2005 J jnl
Test Technology Technical Council Newsletter.
J. Electron. Test.
Bruce C. Kim
2005 J jnl
Test Technology Technical Council Newsletter.
J. Electron. Test.
Bruce C. Kim
2005 J jnl
The Newsletter of Test Technology Council of the IEEE Computer Society.
J. Electron. Test.
Bruce C. Kim
2004 B conf
A new BIST scheme for 5GHz low noise amplifiers.
ETS
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
2004 — conf
A new design for built-in self-test of 5GHz low noise amplifiers.
SoCC
Jee-Youl Ryu, Bruce C. Kim
2003 — conf
An Approach for Selection of Test Points for Analog Fault Diagnosis.
DFT
Kranthi K. Pinjala, Bruce C. Kim
2003 A conf
Automatic Diagnostic Program Generation for Mixed Signal Load Board.
ITC
Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam
2003 — conf
Benzocyclobutene (BCB) Based Intracortical Neural Implant.
ICMENS
Kee-Keun Lee, Jiping He, Amarjit Singh, Bruce C. Kim
2003 J jnl
Impact of Parameter Imbalances on Transmit Diversity OFDM System Performance.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Kyung-Geun Lee, Hyoung-Kyu Song, Mi-Jeong Kim, Sang-Tae Kim, Bruce C. Kim, Young-Hwan You
2003 — conf
MEMS Spring Probe for Next Generation Wafer Level Testing.
ICMENS
Kee-Keun Lee, Bruce C. Kim
2003 — conf
RF MEMS Switch for Wireless LAN Applications.
ICMENS
Kee-Keun Lee, Bruce C. Kim
1999 Misc conf
A Novel Test Methodology for MEMS Magnetic Micromotors.
VTS
Bruce C. Kim, Krishna Marella
1999 A conf
A probe scheduling algorithm for MCM substrates.
ITC
Bruce C. Kim, Pinshan Jiang, Se Hyun Park
1998 Misc conf
A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob.
VTS
Rongchang Yan, Bruce C. Kim
1998 A conf
A high throughput test methodology for MCM substrates.
ITC
Bruce C. Kim, David C. Keezer, Abhijit Chatterjee
1997 J jnl
A Survey of Test Techniques for MCM Substrates.
J. Electron. Test.
Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee
1997 A conf
Analog and Mixed-Signal Benchmark Circuits-First Release.
ITC
Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti
1996 B conf
An integrated network management system: the design for AIN and B-ISDN.
NOMS
Bruce C. Kim, Hisao Fujikawa, Tetsuji Tamaka
1996 J jnl
DC Built-In Self-Test for Linear Analog Circuits.
IEEE Des. Test Comput.
Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
1996 Misc conf
Low-cost DC built-in self-test of linear analog circuits using checksums.
VLSI Design
Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
1996 Misc conf
Low-cost diagnosis of defects in MCM substrate interconnections.
VTS
Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan
1995 A conf
A Novel Low-Cost Approach to MCM Interconnect Test.
ITC
Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel
1994 B conf
A Methodology for Generation and Collection of Multiprocessor Traces.
MASCOTS
Paul J. Bond, Bruce C. Kim, Christopher A. Lee, David E. Schimmel
1992 B conf
Network Performance Monitoring And Fault Detection On The Gtnet.
NOMS
Philip W. Mathis, Bruce C. Kim
1991 B conf
Defense data network management system.
LCN
Bruce C. Kim