Bram Kruseman

32 papers A 14B 4Misc 5Journal 7Unranked 2
YearRankTypeTitle / Venue / Authors
2016 B conf
ETS 2016 foreword.
ETS
Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos
2015 B conf
Testing of Analog/Mixed Signal ICs: Past, present and future.
ETS
Bram Kruseman
2013 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2013 B conf
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes?
ETS
Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman
2012 J jnl
Defect Oriented Testing for Analog/Mixed-Signal Designs.
IEEE Des. Test Comput.
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
2012 J jnl
Diagnosis of Local Spot Defects in Analog Circuits.
IEEE Trans. Instrum. Meas.
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman
2012 J jnl
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak
2011 — conf
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices.
DFT
Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui
2011 A conf
Defect Oriented Testing for analog/mixed-signal devices.
ITC
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
2011 J jnl
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 J jnl
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. Very Large Scale Integr. Syst.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2011 A conf
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.
DATE
Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing
2010 B conf
Diagnosis of full open defects in interconnect lines with fan-out.
ETS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2010 Misc conf
Impact of Temperature on Test Quality.
VLSI Design
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
2010 A conf
NIM- a noise index model to estimate delay discrepancies between silicon and simulation.
DATE
Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel
2008 Misc conf
Full Open Defects in Nanometric CMOS.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
2008 A conf
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
ITC
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
2007 Misc conf
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 Misc conf
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
2007 J jnl
Modeling Power Supply Noise in Delay Testing.
IEEE Des. Test Comput.
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger
2007 Misc conf
On Performance Testing with Path Delay Patterns.
VTS
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud
2006 A conf
On test conditions for the detection of open defects.
DATE
Bram Kruseman, Manuel Heiligers
2006 A conf
Power Supply Noise in Delay Testing.
ITC
Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
2004 A conf
On Hazard-free Patterns for Fine-delay Fault Testing.
ITC
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
2004 A conf
Systematic Defects in Deep Sub-Micron Technologies.
ITC
Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
2004 A conf
Trends in Testing Integrated Circuits.
ITC
Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge
2003 A conf
Detection of Resistive Shorts in Deep Sub-micron Technologies.
ITC
Bram Kruseman, Stefan van den Oetelaar
2002 A conf
Comparison of IDDQ Testing and Very-Low Voltage Testing.
ITC
Bram Kruseman, Stefan van den Oetelaar, Josep Rius
2001 A conf
The future of delta I_DDQ testing.
ITC
Bram Kruseman, Rudger van Veen, Kees van Kaam
2000 — conf
Comparison of defect detection capabilities of current-based and voltage-based test methods.
ETW
Bram Kruseman
1999 A conf
Transient current testing of 0.25 μm CMOS devices.
ITC
Bram Kruseman, Peter Janssen, Victor Zieren