Brady Benware

36 papers A 13B 3Misc 7Journal 6Unranked 7
YearRankTypeTitle / Venue / Authors
2018 — conf
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests.
DFT
Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman
2017 — conf
Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data.
ATS
Wu-Tung Cheng, Randy Klingenberg, Brady Benware, Wu Yang, Manish Sharma, Geir Eide, Yue Tian, Sudhakar M. Reddy, Yan Pan, Sherwin Fernandes, Atul Chittora
2017 — conf
Scan Chain Diagnosis Based on Unsupervised Machine Learning.
ATS
Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng
2015 — conf
Diagnosing timing related cell internal defects for FinFET technology.
VLSI-DAT
Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke
2014 — conf
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models.
ATS
Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma
2014 Misc conf
Innovative practices session 2C: Advanced in yield learning.
VTS
Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala
2013 Misc conf
Distributed dynamic partitioning based diagnosis of scan chain.
VTS
Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
2012 J jnl
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results.
IEEE Des. Test Comput.
Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann
2012 A conf
Improved volume diagnosis throughput using dynamic design partitioning.
ITC
Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware
2011 A conf
A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores.
ITC
Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab
2011 B conf
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction.
ETS
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2011 J jnl
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.
J. Electron. Test.
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2011 — conf
On Using Design Partitioning to Reduce Diagnosis Memory Footprint.
Asian Test Symposium
Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware
2010 A conf
Case study of scan chain diagnosis and PFA on a low yield wafer.
ITC
Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen
2010 J jnl
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis.
IEEE Des. Test Comput.
Manish Sharma, Chris Schuermyer, Brady Benware
2010 B conf
Diagnosis of failing scan cells through orthogonal response compaction.
ETS
Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2009 Misc conf
Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study.
VTS
Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware
2008 A conf
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.
ITC
Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann
2008 — conf
Enhancing Transition Fault Model for Delay Defect Diagnosis.
ATS
Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake
2007 B conf
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.
ETS
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware
2007 Misc conf
Silicon Evaluation of Static Alternative Fault Models.
VTS
Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
2006 A conf
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.
ITC
Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
2006 J jnl
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers.
IEEE Des. Test Comput.
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
2006 J jnl
Extracting Defect Density and Size Distributions from Product ICs.
IEEE Des. Test Comput.
Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
2005 A conf
Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC.
ITC
Joel Lurkins, DeAnna Hill, Brady Benware
2005 Misc conf
Defect Screening Using Independent Component Analysis on I_DDQ.
VTS
Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
2005 A conf
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.
ITC
Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware
2005 A conf
The value of statistical testing for quality, yield and test cost improvement.
ITC
Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch
2004 A conf
Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs.
ITC
Brady Benware
2004 A conf
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
ITC
Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
2004 Misc conf
Detection of Temperature Sensitive Defects Using ZTC.
VTS
Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware
2004 A conf
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
ITC
Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
2003 Misc conf
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.
VTS
Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch
2003 A conf
Impact of Multiple-Detect Test Patterns on Product Quality.
ITC
Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
2003 J jnl
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.
IEEE Des. Test Comput.
Robert Madge, Brady Benware, W. Robert Daasch
2003 A conf
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
ITC
Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning