Bradford G. Van Treuren

14 papers A 10B 1Journal 3

Year	Rank	Type	Title / Venue / Authors
2022	A	`conf`	IEEE P1687.1: Extending the Network Boundaries for Test. ITC Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
2021	B	`conf`	Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. ETS Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
2020	A	`conf`	Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
2013	J	`jnl`	Executing IJTAG: Are Vectors Enough? IEEE Des. Test Michele Portolan, Bradford G. Van Treuren, Suresh Goyal
2010	J	`jnl`	A Common Language Framework for Next-Generation Embedded Testing. IEEE Des. Test Comput. Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook
2010	A	`conf`	Scan chain securization though Open-Circuit Deadlocks. ITC Michele Portolan, Bradford G. Van Treuren, Suresh Goyal
2009	A	`conf`	Scalable and efficient integrated test architecture. ITC Michele Portolan, Suresh Goyal, Bradford G. Van Treuren
2008	A	`conf`	A New Language Approach for IJTAG. ITC Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook
2008	A	`conf`	Problems Using Boundary-Scan for Memory Cluster Tests. ITC Bradford G. Van Treuren, Chen-Huan Chiang, Kenneth Honaker
2008	A	`conf`	System JTAG Initiative Group Advancements. ITC Bradford G. Van Treuren
2007	A	`conf`	A practical approach to comprehensive system test & debug using boundary scan based test architecture. ITC Tapan J. Chakraborty, Chen-Huan Chiang, Bradford G. Van Treuren
2007	A	`conf`	JTAG system test in a MicroTCA world. ITC Bradford G. Van Treuren, Adam W. Ley
2005	A	`conf`	JTAG-based vector and chain management for system test. ITC Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda
2003	J	`jnl`	Embedded Boundary Scan. IEEE Des. Test Comput. Bradford G. Van Treuren, José M. Miranda