| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
Vis. Intell.
|
| 2022 | J | jnl |
Adaptive LII-RMPLS based data-driven process monitoring scheme for quality-relevant fault detection.
J. Control. Decis.
|
| 2022 | J | jnl |
IEEE Syst. J.
|
| 2021 | — | conf |
I2MTC
|
| 2021 | J | jnl |
Neural Process. Lett.
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Signal Process.
|
| 2019 | J | jnl |
Integr.
|
| 2019 | — | conf |
SMACD
|
| 2019 | — | conf |
DTIS
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
DFT
|
| 2019 | — | conf |
LATS
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
AHS
|
| 2018 | C | conf |
IOLTS
|
| 2018 | J | jnl |
Microelectron. Reliab.
|
| 2018 | B | conf |
ETS
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
SMACD
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2017 | J | jnl |
J. Syst. Archit.
|
| 2017 | A | conf |
ITC
|
| 2017 | — | conf |
I2MTC
|
| 2016 | — | conf |
ARCS
|
| 2016 | B | conf |
ETS
|
| 2016 | C | conf |
VLSI-SoC
|
| 2016 | C | conf |
IAS
|
| 2016 | C | conf |
DDECS
|
| 2016 | — | — |
|
| 2016 | — | conf |
LATS
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
IEEE Trans. Computers
|
| 2016 | C | conf |
IOLTS
|
| 2015 | — | conf |
ReCoSoC
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | — | conf |
ARC
|
| 2014 | C | conf |
IOLTS
|
| 2014 | B | conf |
ETS
|
| 2013 | C | conf |
IOLTS
|
| 2013 | — | conf |
MTV
|
| 2007 | — | conf |
CCTA
|