Boubekeur Tala-Ighil

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2015 J jnl
Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET.
Microelectron. Reliab.
Boubekeur Tala-Ighil, Jean-Lionel Trolet, Hamid Gualous, Philippe Mary, Stéphane Lefebvre
2013 J jnl
Supercapacitors aging diagnosis using least square algorithm.
Microelectron. Reliab.
Amrane Oukaour, Mathieu Pouliquen, Boubekeur Tala-Ighil, Hamid Gualous, Eric Pigeon, Olivier Gehan, Bertrand Boudart
2012 J jnl
Calendar and cycling ageing of activated carbon supercapacitor for automotive application.
Microelectron. Reliab.
Hamid Gualous, Roland Gallay, Monzer Al Sakka, Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Boudart
2011 J jnl
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition.
Microelectron. Reliab.
Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, Stéphane Lefebvre, Bertrand Boudart
2011 J jnl
Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour.
Microelectron. Reliab.
Boubekeur Tala-Ighil, Amrane Oukaour, Hamid Gualous, Bertrand Boudart, Bertrand Pouderoux, Jean-Lionel Trolet, Marc Piccione
2010 J jnl
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature.
Microelectron. Reliab.
M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani
2010 J jnl
Supercapacitor ageing at constant temperature and constant voltage and thermal shock.
Microelectron. Reliab.
Hamid Gualous, Roland Gallay, G. Alcicek, Boubekeur Tala-Ighil, Amrane Oukaour, Bertrand Boudart, Philippe Makany
2005 J jnl
Trench insulated gate bipolar transistors submitted to high temperature bias stress.
Microelectron. Reliab.
Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart
2004 J jnl
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress.
Microelectron. Reliab.
Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart
2003 J jnl
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.
Microelectron. Reliab.
Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud
2001 J jnl
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating.
Microelectron. Reliab.
Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud