Bongtae Han

13 papers Journal 13
YearRankTypeTitle / Venue / Authors
2024 J jnl
A Simple but Effective Way to Handle Rotating Machine Fault Diagnosis With Imbalanced-Class Data: Repetitive Learning Using an Advanced Domain Adaptation Model.
IEEE Access
Donghwi Yoo, Minseok Choi, Hyunseok Oh, Bongtae Han
2022 J jnl
Degradation Estimation and Prediction of Electronic Packages Using Data-Driven Approach.
IEEE Trans. Ind. Electron.
Alexandru Prisacaru, Przemyslaw Jakub Gromala, Bongtae Han, GuoQi Zhang
2017 J jnl
Assembly yield prediction of plastically encapsulated packages with a large number of manufacturing variables by advanced approximate integration method.
Microelectron. Reliab.
Hsiu-Ping Wei, Bongtae Han, Byeng Dong Youn, Hyuk Shin, Ilho Kim, Hojeong Moon
2017 J jnl
Towards prognostics and health monitoring: The potential of fault detection by piezoresistive silicon stress sensor.
Microelectron. Reliab.
Alicja Palczynska, Alexandru Prisacaru, Przemyslaw Jakub Gromala, Bongtae Han, Dirk Mayer, Tobias Melz
2016 J jnl
In-situ investigation of EMC relaxation behavior using piezoresistive stress sensor.
Microelectron. Reliab.
Alicja Palczynska, Przemyslaw Jakub Gromala, Dirk Mayer, Bongtae Han, Tobias Melz
2016 J jnl
Modified single cantilever adhesion test for EMC/PSR interface in thin semiconductor packages.
Microelectron. Reliab.
Kenny Mahan, Byung Kim, Bulong Wu, Bongtae Han, Ilho Kim, Hojeong Moon, Young Nam Hwang
2014 J jnl
Degradation analysis of secondary lens system and its effect on performance of LED-based luminaire.
Microelectron. Reliab.
Dae-Suk Kim, Bongtae Han, Youn-Jea Kim
2013 J jnl
Optimum design domain of LED-based solid state lighting considering cost, energy consumption and reliability.
Microelectron. Reliab.
Bong-Min Song, Bongtae Han, Joon-Hyun Lee
2012 J jnl
Life prediction of LED-based recess downlight cooled by synthetic jet.
Microelectron. Reliab.
Bong-Min Song, Bongtae Han, Avram Bar-Cohen, Mehmet Arik, Rajdeep Sharma, Stan Weaver
2012 J jnl
Measurements of True Leak Rates of MEMS Packages.
Sensors
Bongtae Han
2010 J jnl
Forward-stepwise regression analysis for fine leak batch testing of wafer-level hermetic MEMS packages.
Microelectron. Reliab.
Changsoo Jang, Byeng Dong Youn, Ping F. Wang, Bongtae Han, Suk-Jin Ham
2008 J jnl
On the applicability of MIL-Spec-based helium fine leak test to packages with sub-micro liter cavity volumes.
Microelectron. Reliab.
Arindam Goswami, Bongtae Han
2005 J jnl
Characterization of flexural and thermo-mechanical behavior of plastic ball grid package assembly using moiré interferometry.
Microelectron. Reliab.
Jinwon Joo, Seungmin Cho, Bongtae Han