| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2023 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2018 | J | jnl |
Ann. Oper. Res.
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2016 | J | jnl |
J. Oper. Res. Soc.
|
| 2015 | J | jnl |
J. Oper. Res. Soc.
|
| 2012 | — | conf |
CASE
|
| 2011 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2008 | J | jnl |
Comput. Stat. Data Anal.
|
| 2007 | J | jnl |
IEICE Trans. Commun.
|
| 2007 | J | jnl |
Int. J. Commun. Syst.
|
| 2005 | J | jnl |
Expert Syst. Appl.
|
| 2005 | J | jnl |
Expert Syst. Appl.
|
| 2004 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2003 | J | jnl |
Int. J. Manuf. Technol. Manag.
|
| 2002 | — | conf |
COMPSTAT
|