| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2025 | J | jnl |
Artif. Intell. Rev.
|
| 2025 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2023 | J | jnl |
Sensors
|
| 2022 | — | conf |
ICCT
|
| 2021 | J | jnl |
J. Sensors
|
| 2021 | — | conf |
NEMS
|
| 2020 | J | jnl |
J. Comput. Methods Sci. Eng.
|
| 2011 | J | jnl |
Int. J. Oper. Res. Inf. Syst.
|
| 2010 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2010 | J | jnl |
CoRR
|
| 2010 | Misc | conf |
ICASSP
|
| 2010 | J | jnl |
CoRR
|
| 2009 | B | conf |
GLOBECOM
|
| 2009 | — | conf |
VTC Spring
|
| 2008 | J | jnl |
Eur. J. Oper. Res.
|
| 2003 | B | conf |
AINA
|