Binhong Li

35 papers C 2Journal 31Unranked 2
YearRankTypeTitle / Venue / Authors
2026 J jnl
A low phase noise VCO with a common-mode resonance self-calibration system.
Microelectron. J.
Shaofeng Tan, Xing Zhao, Chao Li, Borong Liang, Binhong Li, Jianzhong Li, Jing Xu, Jun Luo, Bo Gao, Tian-Chun Ye
2025 J jnl
Compression Hacking: A Supplementary Perspective on Informatics Metric of Language Models from Geometric Distortion.
CoRR
Jianxiang Zang, Meiling Ning, Yongda Wei, Shihan Dou, Jiazheng Zhang, Nijia Mo, Binhong Li, Tao Gui, Qi Zhang, Xuanjing Huang
2025 J jnl
Fast-Convergent Proximity Graphs for Approximate Nearest Neighbor Search.
CoRR
Binhong Li, Xiao Yan, Shangqi Lu
2025 J jnl
FlexIM: Efficient and Verifiable Index Management in Blockchain.
IEEE Trans. Knowl. Data Eng.
Binhong Li, Licheng Lin, Shijie Zhang, Jianliang Xu, Jiang Xiao, Bo Li, Hai Jin
2025 J jnl
Intelligent coal gangue identification: A novel amplitude frequency sensitive neural network.
Expert Syst. Appl.
Zipeng Zhang, Zhencai Zhu, Bin Meng, Zheng Yang, Mingke Wu, Xinyu Cheng, Binhong Li, Houguang Liu
2025 J jnl
Low-phase-noise wideband dual-core quad-mode VCO using a mode-switching transformer.
Microelectron. J.
Shaofeng Tan, Xing Zhao, Chao Li, Binhong Li, Jianzhong Li, Tianchun Ye, Bo Gao, Jun Luo
2025 J jnl
Novel empirical curvelet denoising strategy for suppressing mixed noise of microseismic data.
Comput. Geosci.
Liyuan Feng, Binhong Li, Huailiang Li, Jian He
2025 J jnl
Reward Auditor: Inference on Reward Modeling Suitability in Real-World Perturbed Scenarios.
CoRR
Jianxiang Zang, Yongda Wei, Ruxue Bai, Shiyu Jiang, Nijia Mo, Binhong Li, Qiang Sun, Hui Liu
2024 J jnl
A two-stage slicer employing body biasing for 64-Gb/s PAM4 wireline receiver in 22-nm FDSOI technology.
Microelectron. J.
Ai He, Binhong Li, Jianzhong Li, Xing Zhao, Jincai Guo, Jianping Wang, Xiangqian Zeng, Yun Wang, Tianchun Ye, Quan Xue
2024 J jnl
Cloak: Hiding Retrieval Information in Blockchain Systems via Distributed Query Requests.
IEEE Trans. Serv. Comput.
Jiang Xiao, Jian Chang, Licheng Lin, Binhong Li, Xiaohai Dai, Zehui Xiong, Kim-Kwang Raymond Choo, Keke Gai, Hai Jin
2024 J jnl
Using Fuzzy C-Means Clustering to Determine First Arrival of Microseismic Recordings.
Sensors
Xiangyun Zhao, Haihang Chen, Binhong Li, Zhen Yang, Huailiang Li
2023 J jnl
A Portfolio Selection Strategy Based on the Peak Price Involving Randomness.
IEEE Access
Binhong Li, Jiaxi Luo, Hongjie Xu
2023 — conf
Anole: A Lightweight and Verifiable Learned-Based Index for Time Range Query on Blockchain Systems.
DASFAA (1)
Jian Chang, Binhong Li, Jiang Xiao, Licheng Lin, Hai Jin
2023 J jnl
T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test.
IEEE Des. Test
Taochen Gu, Fayu Wan, Jingjie Zhou, Qizheng Ji, Binhong Li, Blaise Ravelo
2022 J jnl
Design and Experimentation of Inductorless Low-Pass NGD Integrated Circuit in 180-nm CMOS Technology.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Fayu Wan, Taochen Gu, Binhong Li, Bo Li, Wenceslas Rahajandraibe, Mathieu Guerin, Sébastien Lalléchère, Blaise Ravelo
2021 J jnl
Examining the Thermal Stress Effect of Electromagnetic Susceptibility of Automotive CAN Controller.
J. Circuits Syst. Comput.
Jianfei Wu, Xiangqian Li, Binhong Li, Yong Xie, Mengjun Wang
2020 J jnl
Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines.
IEEE Access
Xiang Zhou, Binhong Li, Ningdong Li, Blaise Ravelo, Xiaofeng Hu, Qizheng Ji, Fayu Wan, Glauco Fontgalland
2020 J jnl
S-Matrix and Bandpass Negative Group Delay Innovative Theory of Ti-Geometrical Shape Microstrip Structure.
IEEE Access
Xiang Zhou, Taochen Gu, Lili Wu, Fayu Wan, Binhong Li, Nour Mohammad Murad, Sébastien Lalléchère, Blaise Ravelo
2019 J jnl
Negative Group Delay Theory of a Four-Port RC-Network Feedback Operational Amplifier.
IEEE Access
Fayu Wan, Taocheng Gu, Blaise Ravelo, Binhong Li, Jing Cheng, Qingyun Yuan, Junxiang Ge
2019 J jnl
Time-Domain Experimentation of NGD ActiveRC-Network Cell.
IEEE Trans. Circuits Syst. II Express Briefs
Fayu Wan, Ningdong Li, Blaise Ravelo, Junxiang Ge, Binhong Li
2018 J jnl
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Microelectron. Reliab.
Binhong Li, Yang Huang, Jianfei Wu, Yunbo Huang, Bo Li, Qingzhu Zhang, Ling Yang, Fayu Wan, Jiajun Luo, Zhengsheng Han, Huaxiang Yin
2018 J jnl
Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory.
Microelectron. Reliab.
Jianfei Wu, Wei Zhu, Binhong Li, Yafei Li, Hongyi Wang, Mengjun Wang
2018 J jnl
Process variation dependence of total ionizing dose effects in bulk nFinFETs.
Microelectron. Reliab.
Bo Li, Yunbo Huang, Ling Yang, Qingzhu Zhang, Zhongshan Zheng, Binhong Li, Huiping Zhu, Jianhui Bu, Huaxiang Yin, Jiajun Luo, Zhengsheng Han, Haibin Wang
2018 J jnl
The Design Method of the Active Negative Group Delay Circuits Based on a Microwave Amplifier and an RL-Series Network.
IEEE Access
Fayu Wan, Ningdong Li, Blaise Ravelo, Qizheng Ji, Binhong Li, Junxiang Ge
2018 J jnl
The total ionizing dose response of leading-edge FDSOI MOSFETs.
Microelectron. Reliab.
Jian Wang, Binhong Li, Yang Huang, Kai Zhao, Fang Yu, Qiwen Zheng, Qi Guo, Liewei Xu, J. Gao, X. Cai, Y. Cui
2017 J jnl
Investigations on the EFT immunity of microcontrollers with different architectures.
Microelectron. Reliab.
Jianfei Wu, Binhong Li, W. Zhu, H. Wang, L. Zheng
2016 J jnl
Electromagnetic susceptibility characterization of double SOI device.
Microelectron. Reliab.
Binhong Li, Kai Zhao, Jianfei Wu, Xing Zhao, Jianwei Su, Jiantou Gao, Chuang Gao, Jun Luo
2016 J jnl
Microcontroller susceptibility variations to EFT burst during accelerated aging.
Microelectron. Reliab.
Jianfei Wu, Chuangwei Li, Binhong Li, Wei Zhu, Hongyi Wang
2012 J jnl
Prediction of Long-term Immunity of a Phase-Locked Loop.
J. Electron. Test.
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon
2011 J jnl
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.
Microelectron. Reliab.
Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia
2011 — conf
Prediction of long-term immunity of a phase-locked loop.
LATW
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon
2011 J jnl
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.
Microelectron. Reliab.
Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García
2010 J jnl
Ageing effect on electromagnetic susceptibility of a phase locked loop.
Microelectron. Reliab.
Binhong Li, Alexandre Boyer, Sonia Bendhia, Christophe Lemoine
2004 C conf
The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part One. Scattering fields in Cartesian coordinates.
IGARSS
Xie Tao, Binhong Li, Wenjun Chen, Yijun He
2004 C conf
The scattering fields of 2-D sea fractal surface with finite conductivity illuminated by ellipse polarization wave. Part two. Scattering matrix and numerical results.
IGARSS
Xie Tao, Yijun He, Binhong Li, Wenjun Chen