Bingxu Ning

12 papers Journal 10Unranked 2
YearRankTypeTitle / Venue / Authors
2022 J jnl
SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs.
Sci. China Inf. Sci.
Chang Cai, Bingxu Ning, Xue Fan, Tianqi Liu, Lingyun Ke, Gengsheng Chen, Jian Yu, Ze He, Liewei Xu, Jie Liu
2021 — conf
Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits.
ASICON
Shuai Gao, Chang Cai, Bingxu Ning, Ze He, Jie Liu
2020 — conf
Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs.
IRPS
Chang Cai, Tianqi Liu, Jie Liu, Gengsheng Chen, Luchang Ding, Kai Zhao, Bingxu Ning, Mingjie Shen
2016 J jnl
Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs.
Microelectron. Reliab.
Shuang Fan, Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Dawei Bi, Chao Peng, Lei Song, Lihua Dai
2014 J jnl
Total ionizing dose effect in 0.2 μm PDSOI NMOSFETs with shallow trench isolation.
Microelectron. Reliab.
Chao Peng, Zhiyuan Hu, Zhengxuan Zhang, Huixiang Huang, Bingxu Ning, Dawei Bi
2013 J jnl
Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.
Microelectron. Reliab.
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen, Shichang Zou
2013 J jnl
Comprehensive study on the TID effects of 0.13 μm partially depleted SOI NMOSFETs.
Microelectron. J.
Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Ming Chen, Shichang Zou
2012 J jnl
Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology.
Microelectron. Reliab.
Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou
2011 J jnl
Comparison of TID response in core, input/output and high voltage transistors for flash memory.
Microelectron. Reliab.
Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou
2011 J jnl
Impact of within-wafer process variability on radiation response.
Microelectron. J.
Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou
2011 J jnl
The impact of total ionizing radiation on body effect.
Microelectron. J.
Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou
2011 J jnl
Total ionizing dose effects in elementary devices for 180-nm flash technologies.
Microelectron. Reliab.
Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou