| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2025 | J | jnl |
Circuits Syst. Signal Process.
|
| 2025 | J | jnl |
Degradation-Decoupling Vision Enhancement for Intelligent Underwater Robot Vision Perception System.
IEEE Internet Things J.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2024 | J | jnl |
Sensors
|
| 2023 | J | jnl |
Estimation and prediction for the Rayleigh distribution based on double Type-I hybrid censored data.
Commun. Stat. Simul. Comput.
|
| 2023 | C | conf |
SAFEPROCESS
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | — | conf |
ICIT
|
| 2020 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2014 | — | conf |
CSE
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2014 | J | jnl |
Neurocomputing
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | J | jnl |
Circuits Syst. Signal Process.
|
| 2013 | J | jnl |
J. Frankl. Inst.
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
Circuits Syst. Signal Process.
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | J | jnl |
Signal Image Video Process.
|
| 2010 | J | jnl |
Circuits Syst. Signal Process.
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | J | jnl |
IEEE Intell. Transp. Syst. Mag.
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
J. Electron. Test.
|
| 2008 | — | conf |
PACIIA (2)
|