| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Neurocomputing
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2025 | J | jnl |
IEEE Robotics Autom. Lett.
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | J | jnl |
J. Syst. Control. Eng.
|
| 2025 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2024 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Internet Things J.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Autom. Control.
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
Sensors
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | C | conf |
IECON
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | C | conf |
IECON
|
| 2021 | — | conf |
ICPS
|
| 2021 | A* | conf |
ICRA
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
Neurocomputing
|
| 2021 | C | conf |
IECON
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
Neurocomputing
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | C | conf |
IECON
|
| 2021 | J | jnl |
IEEE Trans. Autom. Control.
|
| 2021 | A* | conf |
ICRA
|
| 2021 | — | conf |
ICPS
|
| 2021 | — | conf |
ICPS
|
| 2020 | J | jnl |
Trans. Inst. Meas. Control
|
| 2020 | J | jnl |
Guest Editorial: Special Section on Resilience, Reliability, and Security in Cyber-Physical Systems.
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | — | conf |
AIM
|
| 2020 | J | jnl |
J. Netw. Comput. Appl.
|
| 2020 | J | jnl |
Sensors
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Trans. Cybern.
|
| 2019 | C | conf |
IECON
|
| 2019 | — | conf |
Real-time Motion Control with Iterative Optimization and Robustness Analysis for Autonomous Driving.
AIM
|
| 2019 | J | jnl |
Autom.
|
| 2019 | J | jnl |
Autom.
|
| 2019 | — | conf |
ISIE
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2018 | C | conf |
IECON
|
| 2018 | J | jnl |
Sensors
|
| 2018 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2017 | J | jnl |
IEEE Trans. Cybern.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2017 | — | conf |
ICPHM
|
| 2017 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2017 | C | conf |
IECON
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
ICIT
|
| 2017 | C | conf |
IECON
|
| 2016 | — | conf |
CDC
|
| 2016 | C | conf |
ACC
|
| 2016 | J | jnl |
Explicit synchronisation of heterogeneous dynamics networks via three-layer communication framework.
Int. J. Control
|
| 2016 | J | jnl |
Neurocomputing
|
| 2016 | J | jnl |
Autom.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
Expert Syst. Appl.
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | — | conf |
CDC
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | J | jnl |
An integrated architecture for fault diagnosis and failure prognosis of complex engineering systems.
Expert Syst. Appl.
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | — | conf |
ICCA
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | C | conf |
ACC
|
| 2010 | J | jnl |
Int. J. Syst. Sci.
|
| 2010 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2010 | J | jnl |
Int. J. Control
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2009 | — | conf |
nDS
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | C | conf |
ICARCV
|
| 2007 | C | conf |
ACC
|
| 2007 | J | jnl |
Autom.
|
| 2007 | C | conf |
CCA
|
| 2007 | — | conf |
ISIC
|
| 2007 | — | conf |
ISIC
|
| 2007 | J | jnl |
Int. J. Control
|
| 2006 | C | conf |
ACC
|
| 2006 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2006 | C | conf |
ACC
|
| 2006 | C | conf |
ICARCV
|
| 2005 | C | conf |
ACC
|
| 2005 | C | conf |
ACC
|
| 2005 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2004 | C | conf |
CCA
|
| 2004 | C | conf |
ICARCV
|
| 2004 | — | conf |
RAM
|