| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2026 | J | jnl |
J. Ind. Inf. Integr.
|
| 2026 | J | jnl |
J. Ind. Inf. Integr.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
Neurocomputing
|
| 2025 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
A nonparametric degradation modeling method for remaining useful life prediction with fragment data.
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
Dynamic Vision Enabled Contactless Cross-Domain Machine Fault Diagnosis with Neuromorphic Computing.
IEEE CAA J. Autom. Sinica
|
| 2024 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2023 | — | conf |
AIM
|
| 2023 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | C | conf |
SAFEPROCESS
|
| 2023 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Access
|
| 2016 | — | conf |
URAI
|