| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | J | jnl |
J. Intell. Manuf.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | J | jnl |
Appl. Soft Comput.
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2023 | J | jnl |
Comput. Ind.
|
| 2023 | J | jnl |
Adv. Eng. Informatics
|
| 2023 | J | jnl |
Comput. Ind.
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Adv. Eng. Informatics
|
| 2022 | J | jnl |
Knowl. Based Syst.
|
| 2022 | J | jnl |
Comput. Ind. Eng.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Pattern Recognit.
|
| 2022 | J | jnl |
Symmetry
|
| 2022 | J | jnl |
Expert Syst. Appl.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
J. Intell. Manuf.
|
| 2019 | — | conf |
CASE
|
| 2019 | J | jnl |
Design of deep learning accelerated algorithm for online recognition of industrial products defects.
Neural Comput. Appl.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | — | conf |
HCI (6)
|
| 2016 | J | jnl |
Cogn. Technol. Work.
|
| 2015 | — | conf |
HCI (18)
|
| 2014 | — | conf |
ICIRA (1)
|
| 2013 | — | conf |
ICIRA (2)
|
| 2008 | — | conf |
ICIRA (2)
|
| 2008 | — | conf |
ICIRA (2)
|
| 2008 | — | conf |
ICIRA (2)
|