Bill Eklow

36 papers A* 1A 22B 2Misc 1Journal 7Unranked 3
YearRankTypeTitle / Venue / Authors
2016 J jnl
A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow
2016 J jnl
Recap of the ITC15 Test Conference.
IEEE Des. Test
Bill Eklow
2015 Misc conf
No Fault Found: The root cause.
VTS
Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz
2014 A conf
A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs.
ITC
Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow
2014 — conf
An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs.
ATS
Mehdi Sadi, Zoe Conroy, Bill Eklow, Matthias Kamm, Nematollah Bidokhti, Mark Mohammad Tehranipoor
2014 J jnl
Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ran Wang, Krishnendu Chakrabarty, Bill Eklow
2013 J jnl
On Effective Through-Silicon Via Repair for 3-D-Stacked ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Li Jiang, Qiang Xu, Bill Eklow
2013 A* conf
On effective and efficient in-field TSV repair for stacked 3D ICs.
DAC
Li Jiang, Fangming Ye, Qiang Xu, Krishnendu Chakrabarty, Bill Eklow
2013 — conf
Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs.
Asian Test Symposium
Ran Wang, Krishnendu Chakrabarty, Bill Eklow
2012 A conf
FALCON: Rapid statistical fault coverage estimation for complex designs.
ITC
Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow
2012 J jnl
Managing Complex Boundary-Scan Operations.
IEEE Des. Test Comput.
Bill Eklow
2012 A conf
On effective TSV repair for 3D-stacked ICs.
DATE
Li Jiang, Qiang Xu, Bill Eklow
2012 B conf
Re-using chip level DFT at board level.
ETS
Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson
2012 — conf
Yield enhancement for 3D-stacked ICs: Recent advances and challenges.
ASP-DAC
Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow
2011 A ed.
2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011
ITC
Bill Eklow, R. D. (Shawn) Blanton
2011 J jnl
Major Milestones for Two IEEE Standards Groups in 2011.
IEEE Des. Test Comput.
Bill Eklow
2009 A ed.
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009
ITC
Gordon W. Roberts, Bill Eklow
2008 A conf
Embedded Testing in an In-Circuit Test Environment.
ITC
John Malian, Bill Eklow
2008 A conf
Parametric Testing of Optical Interfaces.
ITC
Brice Achkir, Pavel Zivny, Bill Eklow
2006 A conf
IEEE P1687: Toward Standardized Access of Embedded Instrumentation.
ITC
Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote
2006 B conf
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG).
ETS
Bill Eklow, Ben Bennetts
2006 A conf
Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics.
ITC
Sylvain Tourangeau, Bill Eklow
2005 A conf
A practical perspective on reducing ASIC NTFs.
ITC
Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow
2005 A conf
An update on IEEE 1149.6 - successes and issues.
ITC
Bill Eklow
2005 A conf
IJTAG (internal JTAG): a step toward a DFT standard.
ITC
Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts
2005 A conf
Optimized reasoning-based diagnosis for non-random, board-level, production defects.
ITC
Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow
2004 A conf
"Real Life" System Testing of Networking Equipment.
ITC
Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein
2004 A conf
IP Testing - The Future Differentiator?
DATE
Bill Eklow
2004 A conf
Realizing High Test Quality Goals with Smart Test Resource Usage.
ITC
Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski
2004 A conf
Simulation Based System Level Fault Insertion Using Co-verification Tools.
ITC
Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau
2004 A conf
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.
DATE
Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
2004 A conf
What Do You Mean My Board Test Stinks?
ITC
Bill Eklow
2003 A conf
IEEE 1149.6 - A Practical Perspective.
ITC
Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz
2003 J jnl
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
IEEE Des. Test Comput.
Bill Eklow, Carl Barnhart, Kenneth P. Parker
2002 A conf
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
ITC
Bill Eklow, Carl Barnhart, Kenneth P. Parker
2002 A conf
Is Board Test Worth Talking About?
ITC
Bill Eklow