| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2023 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | C | conf |
IAS
|
| 2015 | C | conf |
IAS
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | C | conf |
IECON
|
| 2014 | — | conf |
ISIE
|
| 2014 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2012 | J | jnl |
IEEE Signal Process. Mag.
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
A Simple Real-Time Fault Signature Monitoring Tool for Motor-Drive-Embedded Fault Diagnosis Systems.
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2009 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2009 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2003 | C | conf |
CCA
|