| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Inf. Fusion
|
| 2026 | J | jnl |
Inf. Fusion
|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
Appl. Soft Comput.
|
| 2026 | J | jnl |
Partial multi-label feature selection via dual-space combination and disambiguation strategy fusion.
Pattern Recognit.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2026 | J | jnl |
Inf. Process. Manag.
|
| 2025 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2025 | J | jnl |
Neural Networks
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
IEEE Trans. Circuits Syst. Video Technol.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Fuzzy Syst.
|
| 2025 | J | jnl |
Displays
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Trans. Inst. Meas. Control
|
| 2024 | — | conf |
IJCRS (2)
|
| 2024 | — | conf |
IJCRS (2)
|
| 2023 | J | jnl |
Trans. Inst. Meas. Control
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Knowl. Data Eng.
|
| 2021 | J | jnl |
IFAC J. Syst. Control.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | C | conf |
IAS
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Trans. Inst. Meas. Control
|
| 2017 | J | jnl |
ACM Trans. Knowl. Discov. Data
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | — | conf |
WAIM
|
| 2014 | A | conf |
CIKM
|
| 2013 | A* | conf |
ICDM
|
| 2013 | A* | conf |
IJCAI
|
| 2013 | — | conf |
BMEI
|
| 2012 | J | jnl |
CoRR
|
| 2012 | J | jnl |
CoRR
|
| 2012 | A | conf |
RecSys
|
| 2012 | — | conf |
ECML/PKDD (2)
|
| 2011 | C | conf |
KSEM
|
| 2010 | A* | conf |
SIGIR
|
| 2009 | J | jnl |
CoRR
|
| 2009 | — | conf |
CompleNet
|