| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
J. Adv. Comput. Intell. Intell. Informatics
|
| 2026 | J | jnl |
Neurocomputing
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | — | conf |
ICCA
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | — | conf |
ICCA
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
Unmanned Syst.
|
| 2023 | — | conf |
ICPHM
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Unmanned Syst.
|
| 2023 | A* | conf |
ICRA
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Robotics Autom. Lett.
|
| 2021 | — | conf |
RCAR
|
| 2021 | J | jnl |
Degradation modeling and remaining useful life prediction for dependent competing failure processes.
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | — | conf |
ROBIO
|
| 2020 | J | jnl |
IEEE Trans. Reliab.
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
Neurocomputing
|
| 2017 | — | conf |
ICPHM
|
| 2015 | J | jnl |
Unmanned Syst.
|
| 2015 | — | conf |
RAM/CIS
|
| 2013 | — | conf |
HCI (11)
|
| 2012 | C | conf |
ACC
|
| 2011 | — | conf |
ICCA
|