| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | Misc | conf |
VLSID
|
| 2026 | Misc | conf |
VLSID
|
| 2025 | — | conf |
ICAA
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | — | conf |
ICPR (32)
|
| 2024 | J | jnl |
IET Quantum Commun.
|
| 2024 | — | conf |
ATS
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | J | jnl |
Innov. Syst. Softw. Eng.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
Comput. methods Biomech. Biomed. Eng. Imaging Vis.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
J. Circuits Syst. Comput.
|
| 2022 | J | jnl |
Demand-Driven Multi-Target Sample Preparation on Resource-Constrained Digital Microfluidic Biochips.
ACM Trans. Design Autom. Electr. Syst.
|
| 2022 | Misc | conf |
VLSID
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | C | conf |
IWCIA
|
| 2021 | J | jnl |
Innov. Syst. Softw. Eng.
|
| 2021 | J | jnl |
WIREs Data Mining Knowl. Discov.
|
| 2021 | J | jnl |
Integr.
|
| 2021 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2021 | J | jnl |
SN Comput. Sci.
|
| 2021 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Trans. Comput. Sci.
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | A* | conf |
DAC
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | C | conf |
ISCAS
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
J. Electron. Test.
|
| 2019 | — | conf |
COMAD/CODS
|
| 2019 | A | conf |
DATE
|
| 2019 | J | jnl |
J. Digit. Imaging
|
| 2019 | — | conf |
ACSS (2)
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
ACSS (2)
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | — | conf |
ATS
|
| 2019 | — | conf |
ISED
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
Integr.
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | J | jnl |
Comput. methods Biomech. Biomed. Eng. Imaging Vis.
|
| 2018 | B | conf |
NSS
|
| 2018 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | C | conf |
IWCIA
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | — | conf |
ASP-DAC
|
| 2018 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2018 | A | conf |
DATE
|
| 2018 | — | conf |
ICICDT
|
| 2018 | Misc | conf |
VLSID
|
| 2017 | J | jnl |
Discret. Appl. Math.
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | — | conf |
PReMI
|
| 2017 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
Inf. Process. Lett.
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
CoRR
|
| 2017 | A | conf |
DATE
|
| 2016 | B | conf |
SMC
|
| 2016 | J | jnl |
Int. J. Image Graph.
|
| 2016 | C | conf |
ICCD
|
| 2016 | B | conf |
SMC
|
| 2016 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | — | conf |
ISED
|
| 2016 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2016 | — | ed. |
IWCIA (Special Track on Applications)
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
J. Math. Imaging Vis.
|
| 2016 | — | conf |
ISMVL
|
| 2016 | B | conf |
SMC
|
| 2016 | B | conf |
SMC
|
| 2016 | C | conf |
VLSI-SoC
|
| 2016 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2016 | J | jnl |
IET Comput. Digit. Tech.
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
Fundam. Informaticae
|
| 2015 | C | ed. |
IWCIA
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | — | conf |
ATS
|
| 2015 | — | conf |
PReMI
|
| 2015 | Misc | conf |
VTS
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | J | jnl |
Ann. Math. Artif. Intell.
|
| 2015 | J | jnl |
Integr.
|
| 2014 | C | conf |
IWCIA
|
| 2014 | — | conf |
ICAA
|
| 2014 | — | conf |
RAIT
|
| 2014 | — | conf |
ISVLSI
|
| 2014 | — | conf |
ICAA
|
| 2014 | J | jnl |
J. Low Power Electron.
|
| 2014 | — | conf |
ICAA
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | A* | conf |
DAC
|
| 2014 | A | conf |
ICCAD
|
| 2014 | J | jnl |
IET Comput. Digit. Tech.
|
| 2014 | — | conf |
ISMVL
|
| 2014 | C | conf |
IWCIA
|
| 2014 | J | jnl |
CoRR
|
| 2014 | J | jnl |
CoRR
|
| 2014 | — | conf |
On Designing Robust Path-Delay Fault Testable Combinational Circuits Based on Functional Properties.
ISVLSI
|
| 2014 | J | jnl |
J. Low Power Electron.
|
| 2014 | J | jnl |
Comput. Vis. Image Underst.
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | J | jnl |
IET Comput. Digit. Tech.
|
| 2014 | — | conf |
ISED
|
| 2014 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2013 | J | jnl |
Int. J. Comput. Math.
|
| 2013 | J | jnl |
CoRR
|
| 2013 | — | conf |
PReMI
|
| 2013 | J | jnl |
Comput. Electr. Eng.
|
| 2013 | C | conf |
DDECS
|
| 2013 | — | conf |
ISED
|
| 2013 | J | jnl |
CoRR
|
| 2013 | — | conf |
VDAT
|
| 2013 | — | conf |
ISED
|
| 2013 | J | jnl |
Theor. Comput. Sci.
|
| 2013 | J | jnl |
Trans. Comput. Sci.
|
| 2013 | — | conf |
VDAT
|
| 2013 | — | conf |
ISED
|
| 2013 | A | conf |
ICCAD
|
| 2013 | C | conf |
RC
|
| 2013 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2013 | — | conf |
ISVLSI
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | — | conf |
SLIP
|
| 2012 | J | jnl |
A linear-time combinatorial algorithm to find the orthogonal hull of an object on the digital plane.
Inf. Sci.
|
| 2012 | — | conf |
ISVLSI
|
| 2012 | — | conf |
CASE
|
| 2012 | — | conf |
CompIMAGE
|
| 2012 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2012 | — | conf |
ISED
|
| 2012 | — | conf |
ISED
|
| 2012 | C | conf |
IWCIA
|
| 2012 | — | conf |
ISVD
|
| 2012 | — | conf |
ISVLSI
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | — | conf |
ISED
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | C | conf |
IWCIA
|
| 2011 | — | conf |
ISED
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | J | jnl |
Int. J. Digit. Libr. Syst.
|
| 2011 | — | conf |
PReMI
|
| 2011 | J | jnl |
Comput. Electr. Eng.
|
| 2011 | Misc | conf |
VLSI Design
|
| 2011 | J | jnl |
Int. J. Imaging Syst. Technol.
|
| 2011 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2011 | J | jnl |
J. Vis. Commun. Image Represent.
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2011 | A | conf |
DATE
|
| 2010 | — | conf |
ISVLSI
|
| 2010 | — | conf |
SoCC
|
| 2010 | B | conf |
WALCOM
|
| 2010 | Misc | conf |
VLSI Design
|
| 2010 | J | jnl |
J. Vis. Commun. Image Represent.
|
| 2010 | — | conf |
Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits.
Asian Test Symposium
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | J | jnl |
J. Low Power Electron.
|
| 2010 | B | conf |
ICFHR
|
| 2010 | J | jnl |
Inf. Process. Lett.
|
| 2010 | J | jnl |
Fundam. Informaticae
|
| 2010 | J | jnl |
IET Comput. Digit. Tech.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | J | jnl |
Int. J. Digit. Libr. Syst.
|
| 2010 | B | conf |
ICFHR
|
| 2009 | — | conf |
NaBIC
|
| 2009 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2009 | — | conf |
GREC
|
| 2009 | C | conf |
IWCIA
|
| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2009 | — | conf |
GREC
|
| 2009 | — | conf |
IWCIA Special Track on Applications
|
| 2009 | J | jnl |
Fundam. Informaticae
|
| 2009 | J | jnl |
Pattern Recognit.
|
| 2009 | J | jnl |
Comput. Electr. Eng.
|
| 2008 | J | jnl |
Fundam. Informaticae
|
| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2008 | J | jnl |
Appl. Soft Comput.
|
| 2008 | — | conf |
ICIIS
|
| 2008 | — | conf |
Bangalore Compute Conf.
|
| 2008 | C | conf |
IWCIA
|
| 2008 | J | jnl |
Discret. Appl. Math.
|
| 2008 | Misc | conf |
VLSI Design
|
| 2008 | J | jnl |
Inf. Process. Lett.
|
| 2008 | J | jnl |
Fundam. Informaticae
|
| 2008 | — | conf |
CCCG
|
| 2007 | J | jnl |
Fundam. Informaticae
|
| 2007 | — | conf |
ICCTA
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | — | conf |
ICCTA
|
| 2007 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2007 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2007 | — | conf |
ICCTA
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
ICCTA
|
| 2007 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2006 | Misc | conf |
VLSI Design
|
| 2006 | A | conf |
GECCO
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | — | conf |
APCCAS
|
| 2006 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2006 | — | conf |
ICVGIP
|
| 2006 | Misc | conf |
VLSI Design
|
| 2006 | J | jnl |
Pattern Recognit.
|
| 2006 | Misc | conf |
VLSI Design
|
| 2006 | Misc | conf |
VLSI Design
|
| 2005 | — | conf |
PReMI
|
| 2005 | J | jnl |
J. Syst. Archit.
|
| 2005 | — | conf |
MTDT
|
| 2005 | — | conf |
ICAPR (1)
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | — | conf |
CCCG
|
| 2005 | J | jnl |
Int. J. Image Graph.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | — | conf |
PReMI
|
| 2005 | — | conf |
CIS (1)
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | — | conf |
ICIP (3)
|
| 2005 | — | conf |
SCIA
|
| 2004 | J | jnl |
J. Comput. Sci. Technol.
|
| 2004 | — | conf |
ICPR (1)
|
| 2004 | — | conf |
ICVGIP
|
| 2004 | — | conf |
ICVGIP
|
| 2004 | Misc | conf |
VLSI Design
|
| 2004 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2004 | J | jnl |
J. Circuits Syst. Comput.
|
| 2004 | Misc | conf |
VLSI Design
|
| 2004 | — | conf |
ASP-DAC
|
| 2003 | C | conf |
CIAC
|
| 2003 | A | conf |
ITC
|
| 2003 | Misc | conf |
VLSI Design
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | J | jnl |
Comput. Geom.
|
| 2003 | J | jnl |
J. Syst. Archit.
|
| 2003 | J | jnl |
IEEE Trans. Computers
|
| 2002 | — | conf |
ASP-DAC/VLSI Design
|
| 2002 | J | jnl |
Fundam. Informaticae
|
| 2002 | J | jnl |
J. Comput. Sci. Technol.
|
| 2002 | — | conf |
ICVGIP
|
| 2002 | — | conf |
ICIP (2)
|
| 2002 | — | conf |
ICVGIP
|
| 2002 | — | conf |
ITCC
|
| 2002 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | — | conf |
ISCAS (5)
|
| 2001 | Misc | conf |
VTS
|
| 2001 | — | conf |
ITCC
|
| 2001 | — | conf |
ICIP (3)
|
| 2001 | Misc | conf |
VLSI Design
|
| 2001 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part A
|
| 2001 | — | conf |
ASP-DAC
|
| 2001 | Misc | conf |
VLSI Design
|
| 2000 | Misc | conf |
VLSI Design
|
| 2000 | J | jnl |
IEEE Trans. Computers
|
| 2000 | J | jnl |
J. Algorithms
|
| 2000 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2000 | Misc | conf |
VLSI Design
|
| 2000 | Misc | conf |
VLSI Design
|
| 1999 | Misc | conf |
VLSI Design
|
| 1999 | — | conf |
ASP-DAC
|
| 1999 | Misc | conf |
VLSI Design
|
| 1999 | Misc | conf |
VLSI Design
|
| 1998 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1998 | Misc | conf |
VLSI Design
|
| 1998 | — | conf |
ASP-DAC
|
| 1998 | Misc | conf |
VLSI Design
|
| 1998 | Misc | conf |
HiPC
|
| 1998 | Misc | conf |
VLSI Design
|
| 1997 | Misc | conf |
VLSI Design
|
| 1996 | J | jnl |
VLSI Design
|
| 1996 | Misc | conf |
VLSI Design
|
| 1996 | Misc | conf |
VLSI Design
|
| 1996 | Misc | conf |
VLSI Design
|
| 1996 | Misc | conf |
VTS
|
| 1996 | — | conf |
CCCG
|
| 1995 | A | conf |
ICCAD
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1995 | Misc | conf |
VLSI Design
|
| 1994 | J | jnl |
IEEE Trans. Computers
|
| 1994 | — | conf |
FSTTCS
|
| 1993 | J | jnl |
IEEE Trans. Computers
|
| 1993 | J | jnl |
J. Electron. Test.
|
| 1993 | Misc | conf |
VLSI Design
|
| 1992 | A* | conf |
DAC
|
| 1991 | A | conf |
ITC
|
| 1991 | C | conf |
ICCD
|
| 1990 | — | conf |
FSTTCS
|
| 1989 | J | jnl |
IEEE Trans. Computers
|
| 1989 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1988 | A | conf |
ICCAD
|
| 1988 | — | conf |
FSTTCS
|
| 1986 | J | jnl |
IEEE Trans. Computers
|
| 1986 | J | jnl |
IEEE Trans. Computers
|
| 1985 | J | jnl |
IEEE Trans. Computers
|
| 1984 | — | conf |
FSTTCS
|
| 1984 | A | conf |
ITC
|
| 1983 | A | conf |
ITC
|