| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2013 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2012 | C | conf |
ETFA
|
| 2012 | — | conf |
MBMV
|
| 2012 | — | conf |
CASE
|
| 2011 | C | conf |
ETFA
|
| 2011 | C | conf |
DDECS
|
| 2011 | J | jnl |
Sci. China Inf. Sci.
|
| 2010 | — | conf |
3DIC
|
| 2010 | — | conf |
DSN Workshops
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2009 | C | conf |
ETFA
|
| 2009 | — | conf |
MBMV
|
| 2008 | C | ed. |
DDECS
|
| 2008 | J | jnl |
Theor. Comput. Sci.
|
| 2007 | — | conf |
DFT
|
| 2006 | J | jnl |
it Inf. Technol.
|
| 2006 | C | conf |
DDECS
|
| 2006 | — | ed. |
MBMV
|
| 2006 | — | conf |
MBMV
|
| 2006 | C | ed. |
DDECS
|
| 2006 | C | conf |
FDL
|
| 2005 | — | conf |
FAC
|
| 2004 | C | conf |
IOLTS
|
| 2004 | — | conf |
ISoLA (Preliminary proceedings)
|
| 2003 | — | conf |
GI Jahrestagung (Schwerpunkt "Sicherheit - Schutz und Zuverlässigkeit")
|
| 2003 | C | conf |
IOLTS
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2000 | A | conf |
DATE
|
| 2000 | — | conf |
ASAP
|
| 2000 | B | conf |
FPL
|
| 2000 | — | conf |
MBMV
|
| 2000 | — | conf |
MBMV
|
| 1999 | — | conf |
EUROMICRO
|
| 1999 | — | conf |
ETW
|
| 1998 | — | conf |
MBMV
|
| 1996 | — | conf |
ED&TC
|
| 1996 | — | conf |
ED&TC
|
| 1994 | — | conf |
EDAC-ETC-EUROASIC
|
| 1984 | — | — |