| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ATS
|
| 2025 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2024 | — | conf |
DFT
|
| 2024 | J | jnl |
Int. J. Softw. Tools Technol. Transf.
|
| 2023 | B | conf |
ETS
|
| 2023 | — | conf |
ATS
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | A | conf |
DATE
|
| 2022 | — | conf |
ATS
|
| 2021 | — | conf |
SESC
|
| 2021 | — | conf |
MBMV
|
| 2021 | — | conf |
ATS
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
MBMV
|
| 2021 | A | conf |
DATE
|
| 2021 | — | conf |
e-Energy
|
| 2021 | Misc | conf |
VTS
|
| 2021 | B | conf |
VMCAI
|
| 2021 | J | jnl |
IEEE Trans. Autom. Control.
|
| 2021 | — | conf |
LATS
|
| 2020 | — | conf |
NILM@SenSys
|
| 2020 | — | conf |
BuildSys
|
| 2020 | B | conf |
ETS
|
| 2020 | — | conf |
NFM
|
| 2020 | J | jnl |
CoRR
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | ch. |
Human Activity Sensing
|
| 2019 | — | conf |
SESC
|
| 2019 | Misc | conf |
FCCM
|
| 2019 | — | conf |
SNR
|
| 2019 | A* | conf |
IJCAI
|
| 2019 | J | jnl |
CoRR
|
| 2019 | C | conf |
FDTC
|
| 2019 | B | conf |
ETS
|
| 2019 | A | conf |
DATE
|
| 2019 | — | conf |
CSEDU (2)
|
| 2019 | A | conf |
ITC
|
| 2019 | — | conf |
e-Energy
|
| 2019 | J | jnl |
J. Satisf. Boolean Model. Comput.
|
| 2018 | — | conf |
MBMV
|
| 2018 | — | ch. |
Advanced Logic Synthesis
|
| 2018 | A | conf |
DATE
|
| 2018 | C | conf |
IOLTS
|
| 2018 | A | conf |
SAT
|
| 2018 | Misc | conf |
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.
VTS
|
| 2018 | A | conf |
UAI
|
| 2018 | — | conf |
MBMV
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | B | conf |
ETS
|
| 2018 | — | conf |
e-Energy
|
| 2018 | B | conf |
ETS
|
| 2017 | — | conf |
MBMV
|
| 2017 | Misc | conf |
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.
VLSID
|
| 2017 | C | conf |
FDTC
|
| 2017 | B | conf |
ETS
|
| 2017 | J | jnl |
Formal Aspects Comput.
|
| 2017 | Misc | conf |
VTS
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | — | conf |
LATS
|
| 2017 | A | conf |
DATE
|
| 2017 | A | conf |
SAT
|
| 2017 | — | conf |
TACAS (1)
|
| 2017 | — | conf |
MACIS
|
| 2017 | J | jnl |
CoRR
|
| 2017 | — | conf |
CDC
|
| 2017 | J | jnl |
CoRR
|
| 2017 | — | conf |
ARCADE@CADE
|
| 2017 | A | conf |
DATE
|
| 2017 | B | conf |
ETS
|
| 2017 | — | conf |
IVSW
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | A | conf |
DATE
|
| 2016 | — | conf |
SC²@SYNASC
|
| 2016 | B | conf |
FMCAD
|
| 2016 | — | conf |
Haifa Verification Conference
|
| 2016 | — | conf |
MBMV
|
| 2016 | A | conf |
SAT
|
| 2016 | — | conf |
GI-Jahrestagung
|
| 2016 | C | conf |
CLUSTER
|
| 2016 | Misc | conf |
VTS
|
| 2016 | B | conf |
ETS
|
| 2016 | — | conf |
LATS
|
| 2016 | — | conf |
ASP-DAC
|
| 2016 | J | jnl |
IACR Cryptol. ePrint Arch.
|
| 2016 | — | conf |
ATS
|
| 2016 | J | jnl |
IEEE Trans. Computers
|
| 2016 | — | conf |
S-CUBE
|
| 2016 | — | conf |
HCC
|
| 2016 | — | conf |
Haifa Verification Conference
|
| 2016 | C | conf |
CICM
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
ACM Commun. Comput. Algebra
|
| 2016 | B | conf |
ATVA
|
| 2016 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2016 | — | conf |
S-CUBE
|
| 2015 | B | conf |
VMCAI
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | Misc | conf |
SETTA
|
| 2015 | B | conf |
FM
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
Log. Methods Comput. Sci.
|
| 2015 | B | conf |
ETS
|
| 2015 | B | conf |
ETS
|
| 2015 | Misc | conf |
VTS
|
| 2015 | B | conf |
ETS
|
| 2015 | A | conf |
SAT
|
| 2015 | — | conf |
SyDe Summer School
|
| 2015 | Misc | conf |
VTS
|
| 2015 | A | conf |
DATE
|
| 2015 | A | conf |
SAT
|
| 2015 | A | conf |
DATE
|
| 2015 | — | conf |
MBMV
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
AI Commun.
|
| 2014 | — | conf |
QEST
|
| 2014 | A | conf |
DATE
|
| 2014 | — | conf |
ATS
|
| 2014 | — | conf |
Haifa Verification Conference
|
| 2014 | — | conf |
SFM
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | A | conf |
DATE
|
| 2014 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2014 | — | conf |
MBMV
|
| 2014 | B | conf |
ATVA
|
| 2014 | — | conf |
QAPL
|
| 2014 | J | jnl |
Theor. Comput. Sci.
|
| 2014 | — | conf |
DeLFI Workshops
|
| 2014 | J | jnl |
Electron. Commun. Eur. Assoc. Softw. Sci. Technol.
|
| 2014 | — | conf |
DTIS
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | J | jnl |
Sci. Comput. Program.
|
| 2014 | A | conf |
ITC
|
| 2014 | A | conf |
DATE
|
| 2014 | B | conf |
FMCAD
|
| 2014 | B | conf |
ETS
|
| 2013 | A | conf |
CADE
|
| 2013 | J | jnl |
CoRR
|
| 2013 | B | conf |
LPNMR
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | A | conf |
DATE
|
| 2013 | — | conf |
CICC
|
| 2013 | A | conf |
ITC
|
| 2013 | A | conf |
DATE
|
| 2013 | — | conf |
MBMV
|
| 2013 | C | conf |
ICCD
|
| 2013 | — | conf |
QEST
|
| 2013 | Misc | conf |
VTS
|
| 2013 | J | jnl |
Inf. Secur. J. A Glob. Perspect.
|
| 2013 | — | conf |
LATW
|
| 2013 | — | conf |
ASP-DAC
|
| 2013 | — | conf |
MTV
|
| 2013 | — | conf |
MBMV
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | — | conf |
GI-Jahrestagung
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | — | conf |
MBMV
|
| 2012 | — | conf |
DFT
|
| 2012 | B | conf |
ATVA
|
| 2012 | Misc | conf |
VLSI Design
|
| 2012 | — | conf |
MBMV
|
| 2012 | B | conf |
ETS
|
| 2012 | A | conf |
ITC
|
| 2012 | A | conf |
SAT
|
| 2012 | — | conf |
MBMV
|
| 2012 | A | conf |
TACAS
|
| 2012 | B | conf |
ETS
|
| 2012 | A | conf |
DATE
|
| 2012 | B | conf |
ETS
|
| 2012 | — | conf |
ISOCC
|
| 2012 | Misc | conf |
VTS
|
| 2012 | — | conf |
ICLS
|
| 2012 | — | conf |
CSEDU (1)
|
| 2012 | A | conf |
ICCAD
|
| 2012 | — | conf |
FACS
|
| 2012 | — | conf |
ISQED
|
| 2012 | B | conf |
ATVA
|
| 2012 | J | jnl |
CoRR
|
| 2012 | J | jnl |
CoRR
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | A | conf |
DATE
|
| 2011 | C | conf |
IOLTS
|
| 2011 | — | conf |
ACSD
|
| 2011 | — | conf |
MTV
|
| 2011 | — | conf |
FMOODS/FORTE
|
| 2011 | — | conf |
FORMATS
|
| 2011 | — | conf |
MBMV
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | C | conf |
IOLTS
|
| 2011 | — | conf |
ASP-DAC
|
| 2011 | B | conf |
ATVA
|
| 2011 | A | conf |
DATE
|
| 2011 | J | jnl |
Formal Methods Syst. Des.
|
| 2011 | C | conf |
COCOA
|
| 2011 | A | conf |
DATE
|
| 2011 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2011 | J | jnl |
Fundam. Informaticae
|
| 2011 | J | jnl |
J. Log. Comput.
|
| 2011 | C | conf |
DDECS
|
| 2011 | C | conf |
MEMOCODE
|
| 2011 | C | conf |
DDECS
|
| 2011 | — | conf |
MBMV
|
| 2011 | B | conf |
ETS
|
| 2011 | J | jnl |
Sci. China Inf. Sci.
|
| 2011 | — | conf |
MBMV
|
| 2010 | — | conf |
Verification over discrete-continuous boundaries
|
| 2010 | — | conf |
MTV
|
| 2010 | — | conf |
MMB/DFT
|
| 2010 | — | conf |
QEST
|
| 2010 | A | conf |
SAT
|
| 2010 | — | conf |
MBMV
|
| 2010 | — | conf |
MBMV
|
| 2010 | J | jnl |
it Inf. Technol.
|
| 2010 | — | conf |
DSN Workshops
|
| 2010 | — | conf |
MBMV
|
| 2010 | — | conf |
QEST
|
| 2010 | J | jnl |
Int. J. Parallel Program.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | — | ed. |
Verification over discrete-continuous boundaries
|
| 2009 | — | conf |
Algorithms and Applications for Next Generation SAT Solvers
|
| 2009 | C | conf |
IOLTS
|
| 2009 | — | ed. |
Algorithms and Applications for Next Generation SAT Solvers
|
| 2009 | Misc | conf |
VTS
|
| 2009 | — | conf |
HPCS
|
| 2009 | J | jnl |
IEEE Trans. Software Eng.
|
| 2009 | B | conf |
VMCAI
|
| 2009 | C | conf |
SSS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
RCRA@AI*IA
|
| 2009 | J | jnl |
J. Satisf. Boolean Model. Comput.
|
| 2009 | A | conf |
SAT
|
| 2009 | Misc | conf |
PDPTA
|
| 2009 | — | conf |
MBMV
|
| 2009 | — | conf |
MBMV
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2009 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2009 | Misc | conf |
VLSI Design
|
| 2008 | B | conf |
ETS
|
| 2008 | A | conf |
DSN
|
| 2008 | Misc | conf |
VTS
|
| 2008 | C | conf |
DDECS
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | — | conf |
DFT
|
| 2008 | C | conf |
DDECS
|
| 2008 | C | conf |
ICCD
|
| 2008 | A | conf |
DATE
|
| 2008 | — | conf |
ISVLSI
|
| 2008 | B | conf |
ETS
|
| 2008 | — | book |
Technische Informatik - eine einführende Darstellung.
|
| 2008 | — | conf |
MBMV
|
| 2007 | — | conf |
MBMV
|
| 2007 | Misc | conf |
VTS
|
| 2007 | — | conf |
MTV
|
| 2007 | A | conf |
ICCAD
|
| 2007 | J | jnl |
CoRR
|
| 2007 | J | jnl |
CoRR
|
| 2007 | — | conf |
MBMV
|
| 2007 | C | conf |
IOLTS
|
| 2007 | A* | conf |
CAV
|
| 2007 | — | conf |
ASP-DAC
|
| 2007 | — | conf |
EUROCAST
|
| 2007 | C | conf |
DDECS
|
| 2007 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | J | jnl |
it Inf. Technol.
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
ATS
|
| 2006 | — | conf |
WCET
|
| 2006 | — | conf |
ATS
|
| 2006 | — | conf |
MTV
|
| 2006 | C | conf |
DDECS
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | — | conf |
BMC@FLoC
|
| 2006 | — | conf |
QEST
|
| 2006 | J | jnl |
it Inf. Technol.
|
| 2006 | — | conf |
ATS
|
| 2006 | — | conf |
DFT
|
| 2006 | — | conf |
MBMV
|
| 2006 | C | conf |
DDECS
|
| 2006 | J | jnl |
J. Graph Algorithms Appl.
|
| 2006 | — | conf |
FMICS/PDMC
|
| 2006 | C | conf |
ICCD
|
| 2006 | B | conf |
ATVA
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | B | conf |
ETS
|
| 2005 | — | conf |
DeLFI Workshops
|
| 2005 | — | conf |
WEA
|
| 2005 | A | conf |
DATE
|
| 2005 | Misc | conf |
PDPTA
|
| 2005 | — | conf |
ISVLSI
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2005 | — | conf |
MTV
|
| 2005 | B | conf |
VMCAI
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | — | conf |
MTV
|
| 2005 | Misc | conf |
VTS
|
| 2005 | — | conf |
PerCom Workshops
|
| 2005 | A | conf |
SAT
|
| 2005 | — | book |
Technische Informatik - eine Einführung.
|
| 2005 | A | conf |
ITC
|
| 2004 | — | conf |
ARCS Workshops
|
| 2004 | B | conf |
ETS
|
| 2004 | — | conf |
MBMV
|
| 2004 | A | conf |
SAT
|
| 2004 | — | conf |
MBMV
|
| 2004 | — | conf |
MTV
|
| 2004 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2004 | — | conf |
MTV
|
| 2004 | — | conf |
AACC
|
| 2004 | — | conf |
ISCAS (5)
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | — | conf |
Asian Test Symposium
|
| 2004 | Misc | conf |
VTS
|
| 2004 | A | conf |
ITC
|
| 2003 | A | conf |
SAT
|
| 2003 | — | conf |
MBMV
|
| 2003 | — | conf |
VLSI
|
| 2003 | A | conf |
DATE
|
| 2003 | J | jnl |
IEEE Trans. Computers
|
| 2003 | — | conf |
ETW
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
Integr.
|
| 2003 | J | jnl |
Formal Methods Syst. Des.
|
| 2003 | C | conf |
VLSI-SOC
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | A | conf |
ITC
|
| 2003 | — | conf |
MBMV
|
| 2002 | C | conf |
ICCD
|
| 2002 | A | conf |
GD
|
| 2002 | — | conf |
ISMVL
|
| 2002 | — | conf |
MBMV
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | J | jnl |
Formal Methods Syst. Des.
|
| 2002 | — | conf |
IOLTW
|
| 2002 | — | conf |
ETW
|
| 2002 | — | conf |
IOLTW
|
| 2002 | — | conf |
MBMV
|
| 2001 | — | conf |
ASP-DAC
|
| 2001 | A* | conf |
DAC
|
| 2001 | — | conf |
MBMV (1)
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | — | conf |
MBMV (1)
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | — | conf |
MBMV (1)
|
| 2001 | — | conf |
ISCAS (5)
|
| 2001 | C | conf |
DSD
|
| 2001 | C | conf |
EMO
|
| 2001 | — | conf |
LATW
|
| 2001 | Misc | conf |
VTS
|
| 2001 | — | conf |
MBMV (1)
|
| 2001 | — | conf |
ASP-DAC
|
| 2001 | — | conf |
Fuzzy Days
|
| 2000 | — | conf |
ETW
|
| 2000 | — | conf |
EUROMICRO
|
| 2000 | A* | conf |
DAC
|
| 2000 | — | conf |
ISPD
|
| 2000 | C | conf |
ICCD
|
| 2000 | J | jnl |
Integr.
|
| 2000 | A | conf |
DATE
|
| 2000 | A | conf |
GECCO
|
| 2000 | — | conf |
MBMV
|
| 2000 | — | conf |
EUROMICRO
|
| 2000 | — | conf |
LATW
|
| 2000 | — | conf |
EUROMICRO
|
| 2000 | — | conf |
MBMV
|
| 1999 | — | conf |
ETW
|
| 1999 | — | conf |
ASP-DAC
|
| 1999 | — | conf |
ISCAS (6)
|
| 1999 | — | conf |
MBMV
|
| 1999 | — | conf |
ISCAS (1)
|
| 1999 | J | jnl |
J. Electron. Test.
|
| 1999 | — | conf |
Fuzzy Days
|
| 1999 | — | conf |
FTCS
|
| 1999 | C | conf |
ICCD
|
| 1999 | J | jnl |
J. Electron. Test.
|
| 1998 | — | book |
|
| 1998 | — | book |
Graphenbasierte Funktionsdarstellung - Boolesche und Pseudo-Boolesche Funktionen.
|
| 1998 | — | conf |
ISMVL
|
| 1998 | J | jnl |
IEEE Trans. Computers
|
| 1998 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1998 | — | conf |
ISMVL
|
| 1998 | J | jnl |
Integr.
|
| 1998 | A | conf |
ICCAD
|
| 1997 | Misc | conf |
VLSI Design
|
| 1997 | Misc | conf |
VLSI Design
|
| 1997 | — | conf |
ED&TC
|
| 1997 | — | conf |
ISMVL
|
| 1997 | A | conf |
ICCAD
|
| 1997 | — | conf |
ASP-DAC
|
| 1997 | A | conf |
TACAS
|
| 1997 | Misc | conf |
VTS
|
| 1997 | J | jnl |
Formal Methods Syst. Des.
|
| 1997 | — | conf |
ASP-DAC
|
| 1997 | Misc | conf |
VTS
|
| 1997 | — | conf |
ISMVL
|
| 1997 | J | jnl |
Sympathy: fast exact minimization of fixed polarity Reed-Muller expressions for symmetric functions.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1997 | — | conf |
ED&TC
|
| 1997 | J | jnl |
IEEE Des. Test Comput.
|
| 1996 | — | conf |
ED&TC
|
| 1996 | — | conf |
Asian Test Symposium
|
| 1996 | J | jnl |
IEEE Trans. Computers
|
| 1996 | — | conf |
ED&TC
|
| 1996 | A | conf |
PPSN
|
| 1996 | A | conf |
ITC
|
| 1996 | — | conf |
EURO-DAC
|
| 1996 | Misc | conf |
VTS
|
| 1995 | J | jnl |
Int. J. Artif. Intell. Tools
|
| 1995 | — | conf |
ICANNGA
|
| 1995 | C | conf |
ICCD
|
| 1995 | — | conf |
ED&TC
|
| 1995 | — | conf |
ASP-DAC
|
| 1995 | — | conf |
FTCS
|
| 1995 | A* | conf |
ICALP
|
| 1995 | J | jnl |
J. Electron. Test.
|
| 1995 | B | conf |
LATIN
|
| 1995 | J | jnl |
Inf. Comput.
|
| 1995 | Misc | conf |
VTS
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | J | jnl |
Integr.
|
| 1995 | — | conf |
ISMVL
|
| 1995 | A* | conf |
DAC
|
| 1995 | — | conf |
Sympathy: fast exact minimization of fixed polarity Reed-Muller expressions for symmetric functions.
ED&TC
|
| 1995 | — | conf |
ED&TC
|
| 1994 | — | conf |
EDAC-ETC-EUROASIC
|
| 1994 | A | conf |
ITC
|
| 1994 | — | conf |
ISMVL
|
| 1994 | A* | conf |
DAC
|
| 1994 | — | conf |
EURO-DAC
|
| 1994 | C | conf |
ICCD
|
| 1994 | Misc | conf |
VLSI Design
|
| 1994 | — | conf |
EDAC-ETC-EUROASIC
|
| 1993 | — | conf |
FTCS
|
| 1993 | Misc | conf |
VLSI Design
|
| 1993 | — | conf |
EURO-DAC
|
| 1992 | — | conf |
EURO-DAC
|
| 1992 | — | conf |
EURO-DAC
|
| 1992 | — | conf |
EURO-DAC
|
| 1992 | B | conf |
MFCS
|
| 1992 | — | ch. |
Informatik
|
| 1992 | A | conf |
STACS
|
| 1991 | J | jnl |
Fundam. Informaticae
|
| 1991 | J | jnl |
Theor. Comput. Sci.
|
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EURO-DAC
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EURO-DAC
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SPAA
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J. Inf. Process. Cybern.
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FTCS
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IEEE Trans. Computers
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Inf. Comput.
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STACS
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AWOC
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DAC
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Inf. Comput.
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SIAM J. Comput.
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MFCS
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Inform. Forsch. Entwickl.
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FOCS
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STACS
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Theoretical Computer Science
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| 1982 | — | — |