Bernard Courtois

88 papers A* 2A 14C 2Misc 17Journal 32Unranked 20

Year	Rank	Type	Title / Venue / Authors
2019	Misc	`conf`	Special Session (New Topic): Emerging Computing and Testing Techniques. VTS Max M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois
2018	Misc	`conf`	Special session on quantum systems: Next challenges in design, test, integration. VTS Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois
2014	Misc	`conf`	New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges. VTS Bozena Kaminska, Bernard Courtois, Chris Bailey
2014	Misc	`conf`	New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. VTS Bozena Kaminska, Bernard Courtois, Mary Ann Maher
2014	J	`jnl`	Special Section NANOTECH 2013. Microelectron. J. Bernard Courtois
2013	Misc	`conf`	New topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics. VTS Bozena Kaminska, Bernard Courtois, Soha Hassoun
2013	Misc	`conf`	New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond. VTS Bozena Kaminska, Bernard Courtois, Massimo Alioto
2013	A	`conf`	Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead. DATE Marco Casale-Rossi, Alberto L. Sangiovanni-Vincentelli, Luca P. Carloni, Bernard Courtois, Hugo De Man, Antun Domic, Jan M. Rabaey
2012	J	`jnl`	Special section NANOTECH 2011. Microelectron. J. Bernard Courtois
2010	—	`conf`	ICs and MEMS for energy management. LATW Bernard Courtois
2009	J	`jnl`	European Nano Systems 2007. Microelectron. J. Bernard Courtois
2009	Misc	`conf`	Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design Bernard Courtois, Kholdoun Torki, Sophie Dumont, Sylvaine Eyraud, Jean-François Paillotin, Gregory di Pendina
2009	Misc	`conf`	Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. VTS Bernard Courtois, Ali Shakouri
2009	Misc	`conf`	Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. VTS Bernard Courtois, Chandu Visweswariah
2008	J	`jnl`	European Nano Systems 2006. Microelectron. J. Bernard Courtois
2007	J	`jnl`	Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR Péter G. Szabó, Balázs Németh, Márta Rencz, Bernard Courtois
2007	A	`conf`	Heterogeneous systems on chip and systems in package. DATE Ian O'Connor, Bernard Courtois, Krishnendu Chakrabarty, N. Delorme, M. Hampton, J. Hartung
2006	Misc	`conf`	Session Abstract. VTS Bernard Courtois
2005	J	`jnl`	Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectron. J. Bernard Courtois
2004	—	`conf`	Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA Bernard Courtois
2004	—	`conf`	On-chip testing of embedded silicon transducers. SoCC Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois
2004	Misc	`conf`	On-chip testing of embedded transducers. VLSI Design Salvador Mir, Libor Rufer, Bernard Courtois
2003	J	`jnl`	Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it Inf. Technol. Bernard Courtois
2001	—	`conf`	An Analog-based Approach for MEMS Testing. LATW Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski
2001	—	`conf`	CMP: The Access to Advanced Low Costy Manufacturing. MSE Kholdoun Torki, Bernard Courtois
2001	Misc	`conf`	Electrically Induced Stimuli For MEMS Self-Test. VTS Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois
2001	J	`jnl`	Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electron. Test. Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois
2000	J	`jnl`	Analog ALC crystal oscillators for high-temperature applications. IEEE J. Solid State Circuits Raúl Andrés Bianchi, Jean-Michel Karam, Bernard Courtois
2000	J	`jnl`	Design of self-checking fully differential circuits and boards. IEEE Trans. Very Large Scale Integr. Syst. Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois
2000	J	`jnl`	Extending Fault-Based Testing to Microelectromechanical Systems. J. Electron. Test. Salvador Mir, Benoît Charlot, Bernard Courtois
2000	J	`jnl`	IDDQ Testing of Submicron CMOS - by Cooling? J. Electron. Test. Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki, Bernard Courtois
2000	—	`conf`	Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz
1999	—	`conf`	Advanced Low Cost Manufacturing From CMP Service. MSE Kholdoun Torki, Bernard Courtois
1999	Misc	`conf`	Design and Test of MEMs. VLSI Design Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1999	—	`conf`	Extending fault-based testing to microelectromechanical systems. ETW Salvador Mir, Benoît Charlot, Bernard Courtois
1999	A	`conf`	Fault modeling of suspended thermal MEMS. ITC Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois
1999	J	`jnl`	Guest Editors' Introduction. IEEE Des. Test Comput. Bernard Courtois, R. D. (Shawn) Blanton
1998	A	`conf`	3D CMOS SOL for high performance computing. ISLPED Selim J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois
1998	J	`jnl`	A Reliable Fail-Safe System. IEEE Trans. Computers Marcelo Lubaszewski, Bernard Courtois
1998	A	`conf`	Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois
1998	A	`conf`	Microsystems Testing: an Approach and Open Problems. DATE Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois
1998	J	`jnl`	Thermal Monitoring of Self-Checking Systems. J. Electron. Test. Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1998	J	`jnl`	Tracing the Thermal Behavior of ICs. IEEE Des. Test Comput. Vladimír Székely, Márta Rencz, Bernard Courtois
1997	J	`jnl`	CAD Tools for Bridging Microsystems and Foundries. IEEE Des. Test Comput. Jean-Michel Karam, Bernard Courtois, Hicham Boutamine
1997	A*	`conf`	CAD and Foundries for Microsystems. DAC Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, Paul Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
1997	—	`conf`	Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois
1997	Misc	`conf`	Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS Vladimír Székely, Márta Rencz, Bernard Courtois
1996	—	`conf`	Applied design and analysis of microsystems. ED&TC Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely
1996	—	`conf`	Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. ED&TC Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik
1996	J	`jnl`	Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electron. Test. Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
1996	J	`jnl`	Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Des. Test Comput. Bozena Kaminska, Bernard Courtois
1996	J	`jnl`	Guest editorial. J. Electron. Test. Bozena Kaminska, Bernard Courtois
1996	—	`conf`	High level CAD melds microsystems with foundries. ED&TC Jean-Michel Karam, Bernard Courtois, M. Bauge
1996	J	`jnl`	Second Therminic Workshop. IEEE Des. Test Comput. Bernard Courtois
1996	—	`conf`	Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
1996	J	`jnl`	Unified built-in self-test for fully differential analog circuits. J. Electron. Test. Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
1995	J	`jnl`	Analog checkers with absolute and relative tolerances. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois
1995	J	`jnl`	Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois
1995	J	`jnl`	Conference Reports. IEEE Des. Test Comput. Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois
1995	Misc	`conf`	Frequency-based BIST for analog circuit testin. VTS Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski
1995	—	`conf`	Mixed-signal circuits and boards for high safety applications. ED&TC Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois
1995	—	`conf`	Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, Parimal Pal Chaudhuri
1994	A	`conf`	Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois
1994	Misc	`conf`	Designing self-exercising analogue checkers. VTS Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois
1993	C	`conf`	Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD F. L. Vargas, Michael Nicolaidis, Bernard Courtois
1992	A	`conf`	Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski
1992	A	`conf`	On the Design of Self-Checking Boundary Scannable Boards. ITC Marcelo Lubaszewski, Bernard Courtois
1992	Misc	`conf`	Towards System level modeling and synthesis. VLSI Design Ahmed Amine Jerraya, Kevin O'Brien, Inhag Park, Bernard Courtois
1991	A	`conf`	Built-In Self-Test for Multi-Port RAMs. ICCAD Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois
1991	A	`conf`	Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC M. Marzouki, J. Laurent, Bernard Courtois
1991	J	`jnl`	Silicon compilation of hierarchical control sections with unified BIST testability. Microprocess. Microsystems Michael Nicolaidis, Kholdoun Torki, Ahmed Amine Jerraya, Bernard Courtois
1990	—	`conf`	NAUTILE: a safe environment for silicon compilation. EURO-DAC Philippe Bondono, Ahmed Amine Jerraya, Armand Hornik, Bernard Courtois, D. Bonifas
1990	—	`conf`	Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks. EURO-DAC F. Darlay, Bernard Courtois
1989	—	`conf`	A generalized theory of fail-safe systems. FTCS Michael Nicolaidis, Serge Noraz, Bernard Courtois
1989	J	`jnl`	Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers René David, Antoine Fuentes, Bernard Courtois
1989	J	`jnl`	Self-checking logic arrays. Microprocess. Microsystems Michael Nicolaidis, Bernard Courtois
1988	J	`jnl`	Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers Ingrid Jansch, Bernard Courtois
1988	A	`conf`	Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC Jean Paul Caisso, Bernard Courtois
1988	J	`jnl`	Strongly Code Disjoint Checkers. IEEE Trans. Computers Michael Nicolaidis, Bernard Courtois
1988	C	`conf`	UBIST version of the SYCO's control section compiler. ICCD Kholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois
1986	A*	`conf`	Principles of the SYCO compiler. DAC Ahmed Amine Jerraya, Patrick Varinot, Robert Jamier, Bernard Courtois
1986	J	`jnl`	Scanning the issue. Proc. IEEE Bernard Courtois, Marco Mezzalama
1986	A	`conf`	Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin
1984	—	`conf`	Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme H. Sahami, Bernard Courtois
1983	J	`jnl`	A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing. Pattern Recognit. Lett. Claire Rubat Du Mérac, P. Jutier, J. Laurent, Bernard Courtois
1981	A	`conf`	Analytical Testing of Data Processing Sections of Integrated CPUs. ITC Bernard Courtois
1976	—	`—`	Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coût. Bernard Courtois
1975	—	`conf`	On balancing hardware-firmware for designing a fault-tolerant computers' series. MICRO (2) Bernard Courtois, Gabriele Saucier