Benoît Charlot

17 papers A 1Misc 1Journal 7Unranked 7
YearRankTypeTitle / Venue / Authors
2019 J jnl
Energy Autonomous Wearable Sensors for Smart Healthcare: A Review.
CoRR
Abhishek Singh Dahiya, Jerome Thireau, Jamila Boudaden, Swatchith Lal, Umair Gulzar, Yan Zhang, Thierry Gil, Nadine Azémard, Peter Ramm, Tim Kiessling, Cian O'Murchu, Fredrik Sebelius, Jonas Tilly, Colm Glynn, Shane Geary, Colm O'Dwyer, Kafil Razeeb, Alain Lacampagne, Benoît Charlot, Aida Todri-Sanial
2008 J jnl
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues.
Microelectron. Reliab.
Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire
2008 J jnl
In-Plane Bistable Nanowire For Memory Devices
CoRR
Benoît Charlot, Winston Sun, Kiyotaka Yamashita, Hiroyuki Fujita, Hiroshi Toshiyoshi
2005 — conf
High damping electrostatic system for vibration energy scavenging.
sOc-EUSAI
Ghislain Despesse, Jean-Jacques Chaillout, Thomas Jager, Jean-Michel Léger, Andrea Vassilev, Skandar Basrour, Benoît Charlot
2005 — conf
Wireless sensor network node with asynchronous architecture and vibration harvesting micro power generator.
sOc-EUSAI
Yasser Ammar, Aurélien Buhrig, Marcin Marzencki, Benoît Charlot, Skandar Basrour, Karine Matou, Marc Renaudin
2004 — conf
On-chip testing of embedded silicon transducers.
SoCC
Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois
2003 J jnl
Building an analogue fault simulation tool and its application to MEMS.
Microelectron. J.
Cosmin Roman, Salvador Mir, Benoît Charlot
2002 — conf
Application of Multi-Domain and Multi-Language Cosimulation to an Optical MEM Switch Design.
ASP-DAC/VLSI Design
Gabriela Nicolescu, S. Martinez, Lobna Kriaa, Wassim Youssef, Sungjoo Yoo, Benoît Charlot, Ahmed Amine Jerraya
2001 — conf
An Analog-based Approach for MEMS Testing.
LATW
Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski
2001 Misc conf
Electrically Induced Stimuli For MEMS Self-Test.
VTS
Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois
2001 J jnl
Generation of Electrically Induced Stimuli for MEMS Self-Test.
J. Electron. Test.
Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois
2001 — —
Modélisation de fautes et conception en vue du test structurel des microsystèmes. (Fault modeling and design-for-test of MEMS).
Benoît Charlot
2000 J jnl
Extending Fault-Based Testing to Microelectromechanical Systems.
J. Electron. Test.
Salvador Mir, Benoît Charlot, Bernard Courtois
2000 — conf
Towards design and validation of mixed-technology SOCs.
ACM Great Lakes Symposium on VLSI
Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz
1999 — conf
Extending fault-based testing to microelectromechanical systems.
ETW
Salvador Mir, Benoît Charlot, Bernard Courtois
1999 A conf
Fault modeling of suspended thermal MEMS.
ITC
Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois
1999 J jnl
On the Integration of Design and Test for Chips Embedding MEMS.
IEEE Des. Test Comput.
Salvador Mir, Benoît Charlot