Benjamin Zeiss

12 papers C 2Journal 3Unranked 7
YearRankTypeTitle / Venue / Authors
2014 J jnl
A conformance test suite for TTCN-3 tools - Black-Box functional testing of TTCN-3 syntax and semantics.
Int. J. Softw. Tools Technol. Transf.
Benjamin Zeiss, András Kovács, Nikolay V. Pakulin, Bogdan Stanca-Kaposta
2009 — conf
Analyzing Response Inconsistencies in Test Suites.
TestCom/FATES
Benjamin Zeiss, Jens Grabowski
2009 — conf
Towards an Integrated Quality Assessment and Improvement Approach for UML Models.
SDL Forum
Akhtar Ali Jalbani, Jens Grabowski, Helmut Neukirchen, Benjamin Zeiss
2008 C conf
A TTCN-3-based Web Service Test Framework.
Software Engineering (Workshops)
Edith Werner, Jens Grabowski, Stefan Troschütz, Benjamin Zeiss
2008 J jnl
An approach to quality engineering of TTCN-3 test specifications.
Int. J. Softw. Tools Technol. Transf.
Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski
2008 — conf
Constructing Test Behavior Models Using Simulated System Answers for the Analysis of Test Behavior Anomalies.
GI Jahrestagung (1)
Benjamin Zeiss, Andreas Ulrich, Jens Grabowski
2008 J jnl
Quality assurance for TTCN-3 test specifications.
Softw. Test. Verification Reliab.
Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski, Paul Baker, Dominic Evans
2007 C conf
Applying the ISO 9126 quality model to test specifications - exemplified for TTCN-3 test specifications.
Software Engineering
Benjamin Zeiss, Diana Vega, Ina Schieferdecker, Helmut Neukirchen, Jens Grabowski
2007 — conf
Automation of Refactoring and Refactoring Suggestions for TTCN-3 Test Suites. The TRex TTCN-3 Refactoring and Metrics Tool.
WRT
Helmut Neukirchen, Benjamin Zeiss
2007 — conf
TTCN-3 Quality Engineering: Using Learning Techniques to Evaluate Metric Sets.
SDL Forum
Edith Werner, Jens Grabowski, Helmut Neukirchen, Nils Röttger, Stephan Waack, Benjamin Zeiss
2006 — conf
Refactoring and Metrics for TTCN-3 Test Suites.
SAM
Benjamin Zeiss, Helmut Neukirchen, Jens Grabowski, Dominic Evans, Paul Baker
2006 — conf
TRex - The Refactoring and Metrics Tool for TTCN-3 Test Specifications.
TAIC PART
Paul Baker, Dominic Evans, Jens Grabowski, Helmut Neukirchen, Benjamin Zeiss