Ben Bennetts - RankMe

16 papers A 5B 2Journal 9

Year	Rank	Type	Title / Venue / Authors
2007	B	`conf`	Electronics Design-for-Test: Past, Present and Future. ETS Ben Bennetts
2006	A	`conf`	IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote
2006	B	`conf`	New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). ETS Bill Eklow, Ben Bennetts
2005	A	`conf`	IJTAG (internal JTAG): a step toward a DFT standard. ITC Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts
2004	A	`conf`	Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
2003	J	`jnl`	Guest Editors' Introduction: Board Test. IEEE Des. Test Comput. Monica Lobetti Bodoni, Ben Bennetts
2003	J	`jnl`	Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. IEEE Des. Test Comput. Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts
1999	J	`jnl`	Boundary Scan: The Internet of Test. IEEE Des. Test Comput. Mike Wondolowski, Ben Bennetts, Adam W. Ley
1999	J	`jnl`	Guest Editors' Introduction: Test and the Product Life Cycle. IEEE Des. Test Comput. Tony Ambler, Ben Bennetts
1996	J	`jnl`	Built-In Self-Test: Assuring System Integrity. Computer Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie
1995	J	`jnl`	Guest Editor's Introduction. IEEE Des. Test Comput. Ben Bennetts
1993	J	`jnl`	Essential reading for the basics and implementation of boundary scan: Parker, K PThe boundary-scan handbook Kluwer Academic, Dordrecht, The Netherlands (1992) ISBN 0 7923 9270 1, £48.00/Dfl. 160.00, pp 282. Microprocess. Microsystems Ben Bennetts
1992	A	`conf`	Macro Testability: The Results of Production Device Applications. ITC Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
1992	A	`conf`	Progress in DFT: A Personal View. ITC Ben Bennetts
1990	J	`jnl`	Test Technology in Europe. IEEE Des. Test Comput. Ben Bennetts
1971	J	`jnl`	Fault Diagnosis of Digital Systems - A Review. Comput. J. Ben Bennetts, D. W. Lewin