Ben Bennetts

16 papers A 5B 2Journal 9
YearRankTypeTitle / Venue / Authors
2007 B conf
Electronics Design-for-Test: Past, Present and Future.
ETS
Ben Bennetts
2006 A conf
IEEE P1687: Toward Standardized Access of Embedded Instrumentation.
ITC
Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote
2006 B conf
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG).
ETS
Bill Eklow, Ben Bennetts
2005 A conf
IJTAG (internal JTAG): a step toward a DFT standard.
ITC
Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts
2004 A conf
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.
DATE
Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
2003 J jnl
Guest Editors' Introduction: Board Test.
IEEE Des. Test Comput.
Monica Lobetti Bodoni, Ben Bennetts
2003 J jnl
Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint.
IEEE Des. Test Comput.
Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts
1999 J jnl
Boundary Scan: The Internet of Test.
IEEE Des. Test Comput.
Mike Wondolowski, Ben Bennetts, Adam W. Ley
1999 J jnl
Guest Editors' Introduction: Test and the Product Life Cycle.
IEEE Des. Test Comput.
Tony Ambler, Ben Bennetts
1996 J jnl
Built-In Self-Test: Assuring System Integrity.
Computer
Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie
1995 J jnl
Guest Editor's Introduction.
IEEE Des. Test Comput.
Ben Bennetts
1993 J jnl
Essential reading for the basics and implementation of boundary scan: Parker, K PThe boundary-scan handbook Kluwer Academic, Dordrecht, The Netherlands (1992) ISBN 0 7923 9270 1, £48.00/Dfl. 160.00, pp 282.
Microprocess. Microsystems
Ben Bennetts
1992 A conf
Macro Testability: The Results of Production Device Applications.
ITC
Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
1992 A conf
Progress in DFT: A Personal View.
ITC
Ben Bennetts
1990 J jnl
Test Technology in Europe.
IEEE Des. Test Comput.
Ben Bennetts
1971 J jnl
Fault Diagnosis of Digital Systems - A Review.
Comput. J.
Ben Bennetts, D. W. Lewin