| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
PRIME
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | C | conf |
DSD
|
| 2023 | — | conf |
DCIS
|
| 2023 | — | conf |
DCIS
|
| 2022 | — | conf |
DCIS
|
| 2022 | — | conf |
CinC
|
| 2022 | — | conf |
DCIS
|
| 2022 | — | conf |
DCIS
|
| 2022 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
IEEE SENSORS
|
| 2020 | — | conf |
I2MTC
|
| 2020 | — | conf |
I2MTC
|
| 2020 | — | conf |
I2MTC
|
| 2020 | C | conf |
ISCAS
|
| 2020 | — | conf |
I2MTC
|
| 2020 | C | conf |
ISCAS
|
| 2019 | J | jnl |
Sensors
|
| 2019 | — | conf |
CCE
|
| 2019 | — | conf |
ICECS
|
| 2018 | J | jnl |
Sensors
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
LASCAS
|
| 2018 | J | jnl |
Sensors
|
| 2018 | — | conf |
LASCAS
|
| 2017 | — | conf |
I2MTC
|
| 2017 | — | conf |
IEEE SENSORS
|
| 2017 | — | conf |
ECCTD
|
| 2017 | J | jnl |
Sensors
|
| 2017 | J | jnl |
Sensors
|
| 2017 | — | conf |
I2MTC
|
| 2017 | C | conf |
ISCAS
|
| 2016 | C | conf |
ISCAS
|
| 2016 | J | jnl |
J. Sensors
|
| 2015 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | C | conf |
ISCAS
|
| 2015 | J | jnl |
Sensors
|
| 2015 | — | conf |
ICIT
|
| 2015 | J | jnl |
Microelectron. J.
|
| 2015 | C | conf |
ISCAS
|
| 2015 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | — | conf |
ICIT
|
| 2014 | C | conf |
ISCAS
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | — | conf |
ECCTD
|
| 2013 | — | conf |
ECCTD
|
| 2013 | C | conf |
ISCAS
|
| 2013 | C | conf |
IECON
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2013 | — | conf |
ECCTD
|
| 2013 | C | conf |
IECON
|
| 2012 | — | conf |
ESSCIRC
|
| 2012 | C | conf |
ISCAS
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2012 | C | conf |
ISCAS
|
| 2011 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2011 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
Sensors
|
| 2011 | — | conf |
ECCTD
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | — | conf |
ECCTD
|
| 2010 | — | conf |
ESSCIRC
|
| 2010 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2010 | C | conf |
ISCAS
|
| 2010 | C | conf |
ISCAS
|
| 2009 | J | jnl |
Sensors
|
| 2009 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2008 | C | conf |
ISCAS
|
| 2008 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2008 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2008 | C | conf |
ISCAS
|
| 2008 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2008 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2007 | C | conf |
ISCAS
|
| 2007 | — | conf |
ECCTD
|
| 2007 | C | conf |
ISCAS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | — | conf |
ECCTD
|
| 2007 | — | conf |
ECCTD
|
| 2006 | C | conf |
ISCAS
|
| 2006 | — | conf |
ICECS
|
| 2006 | — | conf |
ICECS
|
| 2005 | — | conf |
ECCTD
|
| 2005 | — | conf |
ECCTD
|
| 2005 | — | conf |
ISCAS (1)
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2004 | — | conf |
ESSCIRC
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | — | conf |
ISCAS (1)
|
| 2003 | — | conf |
ISCAS (1)
|
| 2003 | J | jnl |
Microelectron. Reliab.
|