Bartomeu Alorda

42 papers A 5B 4C 10Misc 1Journal 13Unranked 9

Year	Rank	Type	Title / Venue / Authors
2024	J	`jnl`	A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors. CoRR Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià Antoni Bota
2024	J	`jnl`	An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies. CoRR Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
2024	J	`jnl`	Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics. CoRR Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2024	J	`jnl`	SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results. CoRR Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, Sebastià A. Bota, Jaume Segura
2024	J	`jnl`	SRAM-Based PUF Reliability Prediction Using Cell-Imbalance Characterization in the State Space Diagram. CoRR Gabriel Torrens, Abdel Alheyasat, Bartomeu Alorda, Sebastià A. Bota
2022	—	`conf`	SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications. DCIS Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2020	C	`conf`	Bit-Cell Selection Analysis for Embedded SRAM-Based PUF. ISCAS Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2020	B	`conf`	Intelligent Thermal Storage in the Balearic Islands Hotels with Solar Energy. Intelligent Environments (Workshops) Andreu Moià-Pol, Pere Rullan, Bartomeu Alorda
2020	B	`conf`	New Approach to Indoor Thermal Climate Control Using Natural Building Envelope and Cross Ventilation Techniques. Intelligent Environments (Workshops) Cristian Carmona, Juan Muñoz, Bartomeu Alorda
2020	—	`conf`	Selection of SRAM Cells to improve Reliable PUF implementation using Cell Mismatch Metric. DCIS Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2019	J	`jnl`	A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors. IEEE Trans. Emerg. Top. Comput. Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià A. Bota
2019	B	`conf`	Intelligent Energy Consumption in the Balearic Islands Hotels. Intelligent Environments (Workshops) Andreu Moià-Pol, Pere Rullan, Bartomeu Alorda
2019	B	`conf`	Overheating Mitigation Strategies Analysis: A Mediterranean Case Study. Intelligent Environments (Workshops) Bartomeu Alorda, Cristian Carmona, Juan Muñoz, Francesc Masdeu, Gabriel Horrach
2019	—	`conf`	Weak and Strong SRAM cells analysis in embedded memories for PUF applications. DCIS Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2017	C	`conf`	6T CMOS SRAMs reliability monitoring through stability measurements. IOLTS Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota
2017	—	`conf`	Cantilever NEMS relay-based SRAM devices for enhanced reliability. DTIS Sebastià A. Bota, Jaume Verd, Joan Barceló, Xavier Gili, Bartomeu Alorda, Gabriel Torrens, Carol de Benito, Jaume Segura
2017	—	`conf`	Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift. DTIS Bartomeu Alorda, Gabriel Torrens
2016	J	`jnl`	An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies. Microelectron. Reliab. Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
2016	C	`conf`	On-line write margin estimator to monitor performance degradation in SRAM cores. IOLTS Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
2014	J	`jnl`	Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells. Microelectron. Reliab. Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2014	—	`conf`	Energy consumption savings in ZigBee-based WSN adjusting power transmission at application layer. PATMOS Cristian Carmona, Bartomeu Alorda, Miquel A. Ribot
2014	A	`conf`	Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications. DATE Bartomeu Alorda, Cristian Carmona, Sebastià A. Bota
2013	C	`conf`	Accurate alpha soft error rate evaluation in SRAM memories. IOLTS Sebastià A. Bota, Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, L. A. Segura
2012	C	`conf`	Multi-subject Project Based Learning initiative. EDUCON Bartomeu Alorda, Jaume Verd, Vincent Canals, Kay Suenaga, V. Martinez
2012	—	`conf`	Understanding the Role of Transmission Power in Component-Based Architectures for Adaptive WSN. COMPSAC Workshops Guillermo Rodríguez-Navas, Miquel A. Ribot, Bartomeu Alorda
2011	J	`jnl`	8T vs. 6T SRAM cell radiation robustness: A comparative analysis. Microelectron. Reliab. Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2011	J	`jnl`	Design and evaluation of a microprocessor course combining three cooperative methods: SDLA, PjBL and CnBL. Comput. Educ. Bartomeu Alorda, Kay Suenaga, Pere Pons
2011	A	`conf`	Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation. DATE Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2010	C	`conf`	Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. IOLTS Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura
2010	J	`jnl`	Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination. IEEE Trans. Circuits Syst. II Express Briefs Gabriel Torrens, Bartomeu Alorda, Salvador Barceló, José Luis Rosselló, Sebastià A. Bota, Jaume Segura
2010	A	`conf`	Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs. DATE Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2009	C	`conf`	Critical charge characterization in 6-T SRAMs during read mode. IOLTS Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda
2007	J	`jnl`	Charge-based testing BIST for embedded memories. IET Comput. Digit. Tech. Bartomeu Alorda, Ivan de Paúl, Jaume Segura
2005	C	`conf`	A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits. IOLTS Bartomeu Alorda, Sebastià A. Bota, Jaume Segura
2004	C	`conf`	A BIST-based Charge Analysis for Embedded Memories. IOLTS Bartomeu Alorda, Vicent Canals, Ivan de Paúl, Jaume Segura
2004	J	`jnl`	A Two-Level Power-Grid Model for Transient Current Testing Evaluation. J. Electron. Test. Bartomeu Alorda, Vincent Canals, Jaume Segura
2003	C	`conf`	An Evaluation of Built-in vs. Off-chip Strategies for On-line Transient Current Testing. IOLTS Bartomeu Alorda, Jaume Segura
2003	A	`conf`	CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing. ITC Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura
2002	—	`conf`	An Off-Chip Sensor Circuit for On-Line Transient Current Testing. IOLTW Bartomeu Alorda, André Ivanov, Jaume Segura
2002	A	`conf`	Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
2001	Misc	`conf`	Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
2000	—	`conf`	On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. IOLTW Bartomeu Alorda, Ivan de Paúl, Jaume Segura, T. Miller