| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
VTC Spring
|
| 2020 | A | conf |
DATE
|
| 2019 | — | conf |
DSN Workshops
|
| 2018 | B | conf |
SAFECOMP
|
| 2016 | — | conf |
ERMAVSS@DATE
|
| 2014 | A | conf |
DATE
|
| 2014 | A | conf |
DATE
|
| 2012 | C | conf |
ICCD
|
| 2011 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | A | conf |
DATE
|
| 2010 | B | conf |
ETS
|
| 2010 | B | conf |
SAFECOMP
|
| 2010 | B | conf |
ETS
|
| 2010 | — | conf |
Obtaining consistent global state dumps to interactively debug systems on chip with multiple clocks.
HLDVT
|
| 2010 | J | jnl |
Comput. Stat. Data Anal.
|
| 2010 | C | conf |
DSD
|
| 2010 | — | conf |
SoC
|
| 2010 | C | conf |
ETFA
|
| 2010 | J | jnl |
Sensors
|
| 2009 | A | conf |
DATE
|
| 2008 | — | conf |
NOCS
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | J | jnl |
IEEE J. Solid State Circuits
|
| 2008 | Misc | conf |
CODES+ISSS
|
| 2007 | — | conf |
ASP-DAC
|
| 2007 | B | conf |
ETS
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2007 | — | conf |
NOCS
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2005 | A | conf |
ITC
|
| 2004 | A* | conf |
DAC
|
| 2004 | A | conf |
ITC
|
| 2003 | J | jnl |
IEEE Commun. Mag.
|
| 2003 | A | conf |
DATE
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | J | jnl |
J. Electron. Test.
|
| 2003 | A | conf |
ITC
|
| 2002 | A | conf |
ITC
|
| 2002 | — | conf |
ETW
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | A | conf |
ITC
|
| 2002 | A | conf |
ITC
|
| 2002 | Misc | conf |
VTS
|
| 2002 | A | conf |
ITC
|
| 2001 | A | conf |
ITC
|
| 2000 | — | conf |
HLDVT
|
| 1999 | A | conf |
ITC
|