Baris Esen - RankMe

14 papers A 5B 3C 1Misc 1Journal 4

Year	Rank	Type	Title / Venue / Authors
2020	J	`jnl`	Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen
2018	J	`jnl`	ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Des. Test Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2018	J	`jnl`	An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. IEEE Des. Test Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2018	C	`conf`	Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. ISCAS Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama
2017	B	`conf`	A very low cost and highly parallel DfT method for analog and mixed-signal circuits. ETS Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2017	B	`conf`	Automatic testing of analog ICs for latent defects using topology modification. ETS Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2017	A	`conf`	Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2016	A	`conf`	Analog fault coverage improvement using final-test dynamic part average testing. ITC Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen
2016	J	`jnl`	Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. Integr. Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2016	A	`conf`	Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. ITC Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen
2016	A	`conf`	Effective DC fault models and testing approach for open defects in analog circuits. ITC Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren
2015	Misc	`conf`	Automated testing of mixed-signal integrated circuits by topology modification. VTS Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2015	B	`conf`	Automatic generation of autonomous built-in observability structures for analog circuits. ETS Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2014	A	`conf`	Design and test of analog circuits towards sub-ppm level. ITC Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen