Baris Arslan

17 papers A 4C 3Misc 2Journal 2Unranked 5
YearRankTypeTitle / Venue / Authors
2022 — conf
Test Cost-Test Quality Modeling For Adaptive Test.
AQTR
Bekir Zahit Demiray, Baris Arslan
2016 J jnl
Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Baris Arslan, Alex Orailoglu
2016 J jnl
Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Baris Arslan, Alex Orailoglu
2016 — conf
Small delay defect diagnosis through failure observation ordering.
AQTR
Baris Arslan
2013 — —
Adaptive Test Cost and Quality Optimization Through An Effective Yet Efficient Delivery of Chip Specific Tests.
Baris Arslan
2013 — conf
Full exploitation of process variation space for continuous delivery of optimal delay test quality.
ASP-DAC
Baris Arslan, Alex Orailoglu
2013 Misc conf
Tracing the best test mix through multi-variate quality tracking.
VTS
Baris Arslan, Alex Orailoglu
2012 Misc conf
Delay test resource allocation and scheduling for multiple frequency domains.
VTS
Baris Arslan, Alex Orailoglu
2011 — conf
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost.
Asian Test Symposium
Baris Arslan, Alex Orailoglu
2011 A conf
Adaptive test optimization through real time learning of test effectiveness.
DATE
Baris Arslan, Alex Orailoglu
2010 C conf
Delay test quality maximization through process-aware selection of test set size.
ICCD
Baris Arslan, Alex Orailoglu
2004 A conf
CircularScan: A Scan Architecture for Test Cost Reduction.
DATE
Baris Arslan, Alex Orailoglu
2004 A conf
Design space exploration for aggressive test cost reduction in CircularScan architectures.
ICCAD
Baris Arslan, Alex Orailoglu
2004 C conf
Extending the Applicability of Parallel-Serial Scan Designs.
ICCD
Baris Arslan, Ozgur Sinanoglu, Alex Orailoglu
2004 A conf
Test Cost Reduction Through A Reconfigurable Scan Architecture.
ITC
Baris Arslan, Alex Orailoglu
2003 — conf
Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information.
Asian Test Symposium
Baris Arslan, Alex Orailoglu
2002 C conf
Fault Dictionary Size Reduction through Test Response Superposition.
ICCD
Baris Arslan, Alex Orailoglu