Bappaditya Dey

45 papers C 3Misc 1Journal 24Unranked 17

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. SOCC Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2025	J	`jnl`	Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series. CoRR Bappaditya Dey, Daniel Sorensen, MinJin Hwang, Sandip Halder
2025	J	`jnl`	S²RNN: Self-Supervised Reconfigurable Neural Network Hardware Accelerator for Machine Learning Applications. IEEE Internet Things J. Kasem Khalil, Bappaditya Dey, Magdy A. Bayoumi
2025	J	`jnl`	Unsupervised Anomaly Prediction with N-BEATS and Graph Neural Network in Multi-variate Semiconductor Process Time Series. CoRR Daniel Sorensen, Bappaditya Dey, MinJin Hwang, Sandip Halder
2024	J	`jnl`	Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. CoRR Bappaditya Dey, Vic De Ridder, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge
2024	J	`jnl`	Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. CoRR Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt
2024	—	`conf`	Advancing SEM Based Nano-scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. ECCV Workshops (4) Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt
2024	J	`jnl`	An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. CoRR Amit Prasad, Bappaditya Dey, Victor Blanco, Sandip Halder
2024	J	`jnl`	Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review. IEEE Trans. Artif. Intell. Ying-Lin Chen, Sara Sacchi, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray, Stefan De Gendt
2024	J	`jnl`	Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. CoRR Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray
2023	J	`jnl`	A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	A Machine Learning Approach Towards SKILL Code Autocompletion. CoRR Enrique Dehaerne, Bappaditya Dey, Wannes Meert
2023	—	`conf`	Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. PKDD/ECML Workshops (4) Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder
2023	J	`jnl`	Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. CoRR Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder
2023	J	`jnl`	Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE. CoRR Sara Sacchi, Bappaditya Dey, Iacopo Mochi, Sandip Halder, Philippe Leray
2023	J	`jnl`	Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. CoRR Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge
2023	J	`jnl`	Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge
2023	J	`jnl`	SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. CoRR Vic De Ridder, Bappaditya Dey, Sandip Halder, Bartel Van Waeyenberge
2023	J	`jnl`	SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. CoRR MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin
2023	J	`jnl`	YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt
2022	—	`conf`	A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 Enrique Dehaerne, Bappaditya Dey, Sandip Halder
2022	—	`conf`	Adaptive Hardware Architecture for Neural-Network-on-Chip. MWSCAS Kasem Khalil, Bappaditya Dey, Ashok Kumar, Magdy A. Bayoumi
2022	J	`jnl`	Code Generation Using Machine Learning: A Systematic Review. IEEE Access Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert
2022	J	`jnl`	Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. CoRR Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi
2022	J	`jnl`	Deep Learning-Based Defect Classification and Detection in SEM Images. CoRR Bappaditya Dey, Dipam Goswami, Sandip Halder, Kasem Khalil, Philippe Leray, Magdy A. Bayoumi
2021	C	`conf`	A Reversible-Logic Based Architecture for Long Short-Term Memory (LSTM) Network. ISCAS Kasem Khalil, Bappaditya Dey, Ashok Kumar, Magdy A. Bayoumi
2021	—	`conf`	A Reversible-Logic based Architecture for Convolutional Neural Network (CNN). MWSCAS Kasem Khalil, Bappaditya Dey, Ashok Kumar, Magdy A. Bayoumi
2021	—	`conf`	A Reversible-Logic based Architecture for VGGNet. ICECS Bappaditya Dey, Kasem Khalil, Ashok Kumar, Magdy A. Bayoumi
2021	—	`conf`	An Efficient Embryonic Hardware Architecture based on Network-on-Chip. MWSCAS Kasem Khalil, Omar Eldash, Bappaditya Dey, Ashok Kumar, Magdy A. Bayoumi
2021	—	`conf`	An Efficient Reconfigurable Neural Network on Chip. ICECS Kasem Khalil, Bappaditya Dey, Mostafa Abdelrehim, Ashok Kumar, Magdy A. Bayoumi
2020	C	`conf`	A Novel Design Reversible Logic Based Configurable Fault-Tolerant Embryonic Hardware. ISCAS Kasem Khalil, Bappaditya Dey, Yasser Sherazi, Ashok Kumar, Magdy A. Bayoumi
2020	—	`conf`	A Reversible-Logic based Architecture for Artificial Neural Network. MWSCAS Bappaditya Dey, Kasem Khalil, Ashok Kumar, Magdy A. Bayoumi
2020	—	`conf`	Architecture of A Novel Low-Cost Hardware Neural Network. MWSCAS Kasem Khalil, Omar Eldash, Bappaditya Dey, Ashok Kumar, Magdy A. Bayoumi
2019	—	`conf`	A Novel Design Gate based Low-Cost Configurable RO PUF using Reversible Logic. MWSCAS Bappaditya Dey, Kasem Khalil, Ashok Kumar, Magdy A. Bayoumi
2019	—	`conf`	A Novel Reconfigurable Hardware Architecture of Neural Network. MWSCAS Kasem Khalil, Omar Eldash, Bappaditya Dey, Ashok Kumar, Magdy A. Bayoumi
2018	Misc	`conf`	A Low Power Hardware Implementation of Multi-Object DPM Detector for Autonomous Driving. ICASSP Alaa Ali, Oladiran G. Olaleye, Bappaditya Dey, Kasem Khalil, Magdy A. Bayoumi
2018	C	`conf`	Neuro-NoC: Energy Optimization in Heterogeneous Many-Core NoC using Neural Networks in Dark Silicon Era. ISCAS Md Farhadur Reza, Tung Thanh Le, Bappaditya Dey, Magdy A. Bayoumi, Dan Zhao
2018	—	`conf`	Spectrum-Awareness-Based Performance and Scalability of Cognitive Radio Networks. ICC Workshops Oladiran G. Olaleye, Alaa Ali, Kasem Khalil, Bappaditya Dey, Dmitri D. Perkins, Magdy A. Bayoumi
2017	—	`conf`	Fast deep pyramid DPM object detection with region proposal networks. ISSPIT Alaa Ali, Oladiran G. Olaleye, Bappaditya Dey, Magdy A. Bayoumi
2017	—	`conf`	Repair techniques for aged TSVs in 3D integrated circuits. HLDVT Siroos Madani, Kasem Khalil, Bappaditya Dey, Devante Bonton, Magdy A. Bayoumi
2014	J	`jnl`	Segmentation of PET Images for Computer-Aided Functional Quantification of Tuberculosis in Small Animal Models. IEEE Trans. Biomed. Eng. Brent Foster, Ulas Bagci, Ziyue Xu, Bappaditya Dey, Brian Luna, William Bishai, Sanjay Jain, Daniel J. Mollura
2013	—	`conf`	Robust segmentation and accurate target definition for positron emission tomography images using Affinity Propagation. ISBI Brent Foster, Ulas Bagci, Brian Luna, Bappaditya Dey, William Bishai, Sanjay Jain, Ziyue Xu, Daniel J. Mollura