| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | A | conf |
IROS
|
| 2025 | A | conf |
IROS
|
| 2025 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2025 | — | conf |
I2MTC
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Comput. Networks
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | — | conf |
ICIRA (4)
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Sensors
|
| 2024 | — | conf |
ICCVIT
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
Int. J. Robotics Autom.
|
| 2023 | J | jnl |
Sensors
|
| 2023 | B | conf |
ICPADS
|
| 2023 | J | jnl |
Entropy
|
| 2022 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Sensors
|
| 2019 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
Sensors
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Pattern Recognit. Lett.
|
| 2017 | J | jnl |
Multim. Tools Appl.
|
| 2017 | — | conf |
HCC
|
| 2017 | J | jnl |
Clust. Comput.
|
| 2017 | J | jnl |
IEEE Access
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2016 | J | jnl |
Sensors
|
| 2016 | — | conf |
I2MTC
|
| 2016 | — | conf |
ICCSE
|
| 2016 | J | jnl |
EURASIP J. Wirel. Commun. Netw.
|
| 2016 | J | jnl |
Sensors
|
| 2015 | — | conf |
I2MTC
|
| 2015 | — | conf |
I2MTC
|
| 2014 | J | jnl |
Smart Comput. Rev.
|
| 2014 | J | jnl |
Sensors
|
| 2013 | J | jnl |
Sensors
|
| 2013 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | — | conf |
ICCA
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | — | conf |
EMEIT
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | — | conf |
HPCS
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2009 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2003 | J | jnl |
Application of electrical capacitance tomography to the void fraction measurement of two-phase flow.
IEEE Trans. Instrum. Meas.
|
| 2002 | J | jnl |
IEEE Trans. Instrum. Meas.
|