Baojun Liu

13 papers A* 1Journal 10Unranked 2
YearRankTypeTitle / Venue / Authors
2025 J jnl
Beyond Jailbreak: Unveiling Risks in LLM Applications Arising from Blurred Capability Boundaries.
CoRR
Yunyi Zhang, Shibo Cui, Baojun Liu, Jingkai Yu, Min Zhang, Fan Shi, Han Zheng
2025 J jnl
Dense correspondence relationships of 3D facial models under a global and local fitting framework.
Vis. Comput.
Wenyu Ma, Xiaobo Bai, Baojun Liu, Yaqing Yu, Yu Zhu
2025 A* conf
Your Shield is My Sword: A Persistent Denial-of-Service Attack via the Reuse of Unvalidated Caches in DNSSEC Validation.
USENIX Security Symposium
Shuhan Zhang, Shuai Wang, Li Chen, Dan Li, Baojun Liu
2024 — conf
Optimal Few-Mode Self-Similar Pulse Compression in Photonic Crystal Fibers.
CSNDSP
Baojun Liu, Jinhui Yuan, Chao Mei
2024 J jnl
Research on human behaviour recognition method of sports images based on machine learning.
Int. J. Bio Inspired Comput.
Baojun Liu, Zimin Wang
2021 — conf
Research on NPE Algorithm of Ring Main Unit Fault Detection Based on Internet of Things Technology.
ICGEC
Baojun Liu
2020 J jnl
Research on encoding and decoding algorithms of non-binary LDPC code and FPGA implementation.
J. Comput. Methods Sci. Eng.
Zhongxun Wang, Baojun Liu, Min Zhang, Yang Lou
2019 J jnl
Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing.
IEEE Access
Xiaoqiang Liu, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li
2015 J jnl
Reliability for nanomagnetic logic (NML) readout circuit under single event effect.
Microelectron. J.
Baojun Liu, Li Cai, Yan Li, Qiang Kang
2014 J jnl
On-chip readout circuit for nanomagnetic logic.
IET Circuits Devices Syst.
Baojun Liu, Li Cai, Jing Zhu, Qiang Kang, Mingliang Zhang, Xiangye Chen
2012 J jnl
Reliability Evaluation for Single Event Transients on Digital Circuits.
IEEE Trans. Reliab.
Baojun Liu, Li Cai
2012 J jnl
Reliability evaluation for single event crosstalk via probabilistic transfer matrix.
Microelectron. Reliab.
Baojun Liu, Li Cai, Peng Bai, Weidong Peng
2012 J jnl
The impact of Miller and coupling effects on single event transient in logical circuits.
Microelectron. J.
Baojun Liu, Li Cai, Xiaokuo Yang, Hongtu Huang, Peng Bai, Weidong Peng