| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ICCAE
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | — | conf |
RIF
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | — | conf |
RIF
|
| 2024 | J | jnl |
IEEE Access
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
SSD
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
J. Electron. Test.
|
| 2022 | J | jnl |
J. Ambient Intell. Humaniz. Comput.
|
| 2022 | J | jnl |
J. Ambient Intell. Humaniz. Comput.
|
| 2022 | J | jnl |
J. Ambient Intell. Humaniz. Comput.
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
Multim. Tools Appl.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | — | conf |
ICM
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | — | conf |
ICM
|
| 2018 | — | conf |
FSDM
|
| 2017 | — | conf |
ICCA
|
| 2017 | — | conf |
ICCA
|
| 2016 | — | conf |
ICM
|
| 2016 | — | conf |
ICM
|
| 2015 | — | conf |
CCECE
|