Aya Fukami

13 papers Journal 11Unranked 2
YearRankTypeTitle / Venue / Authors
2025 J jnl
Keyless Entry: Breaking and Entering eMMC RPMB with EMFI.
CoRR
Aya Fukami, Richard Buurke
2025 J jnl
Poor Sanitization Practices and Questionable Digital Evidence: A Comprehensive Study of Scope and Impact of Recycled NAND Flash Chips.
IEEE Trans. Dependable Secur. Comput.
Janine Schneider, Aya Fukami, Immanuel Lautner, Maximilian Eichhorn, Denise Moussa, Julian Wolf, Nicole Scheler, Dominic Deuber, Felix C. Freiling, Jaap Haasnoot, Hans Henseler, Simon Malik, Holger Morgenstern, Martin Westman
2024 J jnl
Case of study for in situ memory reading on damaged MultiMedia Card.
Forensic Sci. Int. Digit. Investig.
Fabien Thomas-Brans, Aya Fukami, Q. Clement, Thibaut Heckmann, Damien Sauveron
2024 J jnl
Exploiting RPMB authentication in a closed source TEE implementation.
Forensic Sci. Int. Digit. Investig.
Aya Fukami, Richard Buurke, Zeno Geradts
2024 J jnl
Exploiting RPMB authentication in a closed source TEE implementation.
IACR Cryptol. ePrint Arch.
Aya Fukami, Richard Buurke, Zeno Geradts
2024 — conf
Keyless Entry: Breaking and Entering eMMC RPMB with EMFI.
WISEC
Aya Fukami, Richard Buurke
2023 J jnl
Assessing data remnants in modern smartphones after factory reset.
Forensic Sci. Int. Digit. Investig.
Mattheüs B. Blankesteijn, Aya Fukami, Zeno J. M. H. Geradts
2023 — conf
Data Sanitization on eMMCs.
ASP-DAC
Aya Fukami, Francesco Regazzoni, Zeno J. M. H. Geradts
2022 J jnl
Experimental Evaluation of e.MMC Data Recovery.
IEEE Trans. Inf. Forensics Secur.
Aya Fukami, Sasha Sheremetov, Francesco Regazzoni, Zeno J. M. H. Geradts, Cees de Laat
2021 J jnl
A new model for forensic data extraction from encrypted mobile devices.
Digit. Investig.
Aya Fukami, Radina Stoykova, Zeno J. M. H. Geradts
2019 J jnl
Forensic Analysis of Water Damaged Mobile Devices.
Digit. Investig.
Aya Fukami, Kazuhiro Nishimura
2017 J jnl
Improving the reliability of chip-off forensic analysis of NAND flash memory devices.
Digit. Investig.
Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu
2017 J jnl
NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors.
IEEE Secur. Priv.
Jan Peter van Zandwijk, Aya Fukami