Augusto Tazzoli

15 papers B 1Journal 12Unranked 2
YearRankTypeTitle / Venue / Authors
2013 — conf
A -173 dBc/Hz @ 1 MHz offset Colpitts oscillator using AlN contour-mode MEMS resonator.
CICC
Jabeom Koo, Augusto Tazzoli, Jeronimo Segovai-Fernandez, Gianluca Piazza, Brian P. Otis
2013 B conf
Neurocomputing and associative memories based on ovenized aluminum nitride resonators.
IJCNN
Vehbi Calayir, Tom Jackson, Augusto Tazzoli, Gianluca Piazza, Larry T. Pileggi
2012 J jnl
K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability.
Microelectron. Reliab.
Anna Persano, Augusto Tazzoli, Paola Farinelli, Gaudenzio Meneghesso, Pietro Siciliano, Fabio Quaranta
2011 — conf
Aluminum Nitride reconfigurable RF-MEMS front-ends.
ASICON
Augusto Tazzoli, Matteo Rinaldi, Chengjie Zuo, Nipun Sinha, Jan Van der Spiegel, Gianluca Piazza
2011 J jnl
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches.
Microelectron. Reliab.
Jacopo Iannacci, Alessandro Faes, A. Repchankova, Augusto Tazzoli, Gaudenzio Meneghesso
2011 J jnl
ESD sensitivity of a GaAs MMIC microwave power amplifier.
Microelectron. Reliab.
Augusto Tazzoli, Isabella Rossetto, Enrico Zanoni, Dai Yufeng, Tiziana Tomasi, Gaudenzio Meneghesso
2010 J jnl
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism.
Microelectron. Reliab.
Jacopo Iannacci, A. Repchankova, Alessandro Faes, Augusto Tazzoli, Gaudenzio Meneghesso, Gian-Franco Dalla Betta
2010 J jnl
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches.
Microelectron. Reliab.
Augusto Tazzoli, Marco Barbato, F. Mattiuzzo, V. Ritrovato, Gaudenzio Meneghesso
2010 J jnl
Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform.
Microelectron. Reliab.
Augusto Tazzoli, Martina Cordoni, Paolo Colombo, C. Bergonzoni, Gaudenzio Meneghesso
2009 J jnl
Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology.
Microelectron. Reliab.
Augusto Tazzoli, Lorenzo Cerati, A. Andreini, Gaudenzio Meneghesso
2009 J jnl
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test.
Microelectron. Reliab.
Nicolo Ronchi, Franco Zanon, Antonio Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso
2008 J jnl
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields.
Microelectron. Reliab.
Augusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, Philippe Bove, R. Langer, J. Thorpe
2008 J jnl
Thermal storage effects on AlGaN/GaN HEMT.
Microelectron. Reliab.
Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini
2007 J jnl
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology.
Microelectron. Reliab.
Augusto Tazzoli, Fabio Alessio Marino, Martina Cordoni, A. Benvenuti, Paolo Colombo, Enrico Zanoni, Gaudenzio Meneghesso
2005 J jnl
A novel fast and versatile temperature measurement system for LDMOS transistors.
Microelectron. Reliab.
Augusto Tazzoli, Gaudenzio Meneghesso, Enrico Zanoni