Aubin Roy

13 papers A 7B 2Journal 3Unranked 1
YearRankTypeTitle / Venue / Authors
2012 J jnl
Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan.
IEEE Des. Test Comput.
Stephen K. Sunter, Aubin Roy
2011 B conf
A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution.
ETS
Stephen K. Sunter, Aubin Roy
2011 A conf
Adaptive parametric BIST of high-speed parallel I/Os via standard boundary scan.
ITC
Stephen K. Sunter, Aubin Roy
2008 J jnl
Noise-Insensitive Digital BIST for any PLL or DLL.
J. Electron. Test.
Stephen K. Sunter, Aubin Roy
2007 A conf
A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes.
ITC
Stephen K. Sunter, Aubin Roy
2007 B conf
Purely Digital BIST for Any PLL or DLL.
ETS
Stephen K. Sunter, Aubin Roy
2007 — conf
Testing SerDes beyond 4 Gbps - changing priorities.
CICC
Stephen K. Sunter, Aubin Roy
2006 A conf
Structural Tests for Jitter Tolerance in SerDes Receivers.
ITC
Stephen K. Sunter, Aubin Roy
2005 A conf
Structural tests for jitter tolerance in SerDes receivers.
ITC
Stephen K. Sunter, Aubin Roy
2004 A conf
An Automated, Complete, Structural Test Solution for SERDES.
ITC
Stephen K. Sunter, Aubin Roy, Jean-Francois Cote
2004 J jnl
On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz.
IEEE Des. Test Comput.
Stephen K. Sunter, Aubin Roy
2002 A conf
High Accuracy Stimulus Generation for A/D Converter BIST.
ITC
Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello
1999 A conf
BIST for phase-locked loops in digital applications.
ITC
Stephen K. Sunter, Aubin Roy