Atefe Dalirsani

12 papers A 1B 1C 2Misc 1Journal 2Unranked 4
YearRankTypeTitle / Venue / Authors
2017 J jnl
Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip.
IEEE Trans. Computers
Gert Schley, Atefe Dalirsani, Marcus Eggenberger, Nadereh Hatami, Hans-Joachim Wunderlich, Martin Radetzki
2016 — conf
Functional Diagnosis for Graceful Degradation of NoC Switches.
ATS
Atefe Dalirsani, Hans-Joachim Wunderlich
2015 — conf
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures.
ATS
Michael A. Kochte, Atefe Dalirsani, Andrea Bernabei, Martin Omaña, Cecilia Metra, Hans-Joachim Wunderlich
2015 — —
Self-diagnosis in Network-on-Chips.
Atefe Dalirsani
2014 C conf
Area-efficient synthesis of fault-secure NoC switches.
IOLTS
Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich
2014 — conf
On Covering Structural Defects in NoCs by Functional Tests.
ATS
Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich
2014 Misc conf
Structural Software-Based Self-Test of Network-on-Chip.
VTS
Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich
2013 — conf
SAT-based code synthesis for fault-secure circuits.
DFTS
Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich
2012 J jnl
Structural Test and Diagnosis for Graceful Degradation of NoC Switches.
J. Electron. Test.
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
2011 B conf
Structural Test for Graceful Degradation of NoC Switches.
ETS
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich
2007 C conf
An Analytical Model for Reliability Evaluation of NoC Architectures.
IOLTS
Atefe Dalirsani, Mohammad Hosseinabady, Zainalabedin Navabi
2007 A conf
Using the inter- and intra-switch regularity in NoC switch testing.
DATE
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabedin Navabi