Aswin Sreedhar

14 papers A 6C 4Journal 2Unranked 2
YearRankTypeTitle / Venue / Authors
2012 J jnl
On Reliability Trojan Injection and Detection.
J. Low Power Electron.
Aswin Sreedhar, Sandip Kundu, Israel Koren
2011 A conf
Modeling manufacturing process variation for design and test.
DATE
Sandip Kundu, Aswin Sreedhar
2011 A conf
On design of test structures for lithographic process corner identification.
DATE
Aswin Sreedhar, Sandip Kundu
2011 — conf
On discovery of "missing" physical design rules via diagnosis of soft-faults.
ISQED
Aswin Sreedhar, Sandip Kundu
2011 A conf
Physically unclonable functions for embeded security based on lithographic variation.
DATE
Aswin Sreedhar, Sandip Kundu
2010 — conf
TURBONFS: turbo nand flash search.
ACM Great Lakes Symposium on VLSI
Shruti Vyas, Aswin Sreedhar, Sandip Kundu
2009 A conf
On linewidth-based yield analysis for nanometer lithography.
DATE
Aswin Sreedhar, Sandip Kundu
2009 C conf
Optical lithography simulation using wavelet transform.
ICCD
Rance Rodrigues, Aswin Sreedhar, Sandip Kundu
2009 C conf
Statistical timing analysis based on simulation of lithographic process.
ICCD
Aswin Sreedhar, Sandip Kundu
2008 J jnl
Lithography Simulation Basics and a Study on Impact of Lithographic Process Window on Gate and Path Delays.
J. Low Power Electron.
Aswin Sreedhar, Sandip Kundu
2008 C conf
Modeling and analysis of non-rectangular transistors caused by lithographic distortions.
ICCD
Aswin Sreedhar, Sandip Kundu
2008 A conf
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.
DATE
Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
2008 A conf
Statistical Yield Modeling for Sub-wavelength Lithography.
ITC
Aswin Sreedhar, Sandip Kundu
2007 C conf
On modeling impact of sub-wavelength lithography on transistors.
ICCD
Aswin Sreedhar, Sandip Kundu